Mass Spectrometer with Ion Capture for Isomer Diffraction
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Solution Overview
Problem
Conventional mass spectrometers struggle to efficiently perform electron diffraction measurements, which require longer times to achieve sufficient intensity, compared to mass spectrometry, and often necessitate additional auxiliary measurements to obtain molecular structure information, leading to inefficiencies.
Innovation Solution
A mass spectrometer configuration that integrates an ionization section, mass separation section, ion detector, ion capture section, and auxiliary measurement section, allowing for simultaneous mass spectrometric analysis and electron diffraction measurements by selectively capturing and analyzing ions with a digital ion trap and electron beam irradiation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electron diffraction measurement is performed using conventional ion trap apparatus, then molecular structure information can be obtained, but measurement time becomes extremely long (5-6 hours) to achieve sufficient intensity
Solution Approach 1:
The patent combines a mass spectrometer with an electron diffraction measurement device into an integrated system. The mass spectrometer performs rapid mass separation and selection of ions, then transfers selected ions to the electron diffraction apparatus. This merging allows the system to leverage the speed of mass spectrometry while obtaining molecular structure information through electron diffraction, significantly reducing the total measurement time from hours to minutes.
Solution Approach 2:
The mass spectrometer performs preliminary ion selection and mass separation before the electron diffraction measurement. By pre-selecting specific ions of interest and removing unwanted ions through mass filtration, the system ensures that only relevant ions enter the electron diffraction apparatus, increasing the efficiency and intensity of the subsequent measurement while reducing required measurement time.
2Loss of information
If multiple auxiliary measurements are performed to obtain molecular structure information, then comprehensive data can be acquired, but measurement efficiency decreases and analysis time increases
Solution Approach 1:
The integrated system serves multiple functions within a single measurement workflow: mass separation, ion selection, and electron diffraction measurement. The mass spectrometer component provides universal ion analysis capability while the electron diffraction component adds molecular structure determination, creating a multi-functional system that eliminates the need for separate auxiliary measurements and improves overall productivity.
3Measurement precision
If ion trap is used for electron diffraction measurement, then molecular structure data can be obtained, but space charge distortions occur in the ion trap
Solution Approach 1:
The patent extracts the electron diffraction measurement function from the conventional ion trap apparatus and combines it with a mass spectrometer system. By using the mass spectrometer's ion selection and transfer capabilities followed by electron diffraction measurement in a separate detection region, the system avoids the space charge distortion problems inherent in traditional ion trap electron diffraction while maintaining the ability to obtain molecular structure data.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient acquisition of molecular structure information for isomers and similar compounds within a single measurement operation, reducing analysis time and increasing data intensity, while avoiding space charge distortions in ion traps.
Implementation Method 1
an ionization section configured to generate ions from a sample
Implementation Method 2
a mass separation section configured to separate ions generated by the ionization section according to mass-to-charge ratio
Implementation Method 3
an auxiliary measurement section configured to measure a physical quantity of the ion captured by the ion capture section, where the physical quantity is different from the mass-to-charge ratio
Data Source
AI summary
A mass spectrometer (1) includes: an ionization section (201) configured to generate ions from a sample; a mass separation section (231, 235) configured to separate ions generated by the ionization section according to mass-to-charge ratio; an ion detector (237) configured to detect an ion separated by the mass separation section; an ion capture section (31) configured to capture ions separated by the mass separation section; and an electron beam detection section (32) configured to detect an electron beam diffracted by ions captured within the ion capture section (31). This mass spectrometer is capable of performing, in a single measurement operation, both a mass spectrometric analysis and an electron-beam diffraction measurement for distinguishing between isomers. The electron-beam diffraction measurement can be more efficiently performed than in a conventional device of this type.