Mass Spectrometer Noise Source Localization by Enable Interval Analysis
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Solution Overview
Problem
Existing measurement devices face challenges in identifying noise sources among multiple noise sources, leading to degraded signal-to-noise ratios and increased maintenance time when abnormal noise patterns occur.
Innovation Solution
A measurement device equipped with an abnormality detection module that stores enable intervals for device components and determines noise sources based on analysis results, allowing for the estimation of noise source ranges and rapid identification of defective locations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual checking of each device location is performed to identify noise sources, then noise source identification can be achieved, but maintenance time and productivity are significantly reduced
Solution Approach 1:
The measurement device performs self-diagnosis by automatically detecting and identifying noise sources through the abnormality detection module. The system monitors its own operational state, compares measured values against reference data, and autonomously identifies abnormal portions without requiring manual intervention, thereby resolving the contradiction between accurate noise source identification and reduced maintenance time
Solution Approach 2:
The patent replaces manual mechanical checking with an automated electronic detection system. The abnormality detection module uses signal processing and automated comparison algorithms to identify noise sources, substituting the manual mechanical inspection process with an electronic automated system that achieves both high accuracy and time efficiency
2Object-affected harmful factors
If multiple noise sources are present in the measurement device, then comprehensive noise coverage is achieved, but identifying the specific defective location becomes more difficult
Solution Approach 1:
The patent segments the noise identification process by measuring and analyzing each component's operational state separately. The abnormality detection module divides the overall system into individual measurement units, detects noise from each unit independently, and identifies specific defective locations through localized signal analysis, thereby resolving the difficulty of locating defects among multiple noise sources
Solution Approach 2:
The patent introduces reference data as an intermediary element that facilitates noise source identification. The abnormality detection module compares measured operational data against reference data to identify deviations, using this intermediary comparison mechanism to pinpoint specific defective locations even when multiple noise sources are present in the system
Data Source
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AI summary
A measurement device and a mass spectrometer capable of estimating a range of an abnormal portion that is a noise source of noise superimposed on a detection signal are provided. In order to achieve the above object, a measurement device includes: a measurement unit configured to measure a measurement target and output a measurement signal; a detector configured to detect the measurement signal and output a detection signal; an analysis processing unit configured to calculate and output an analysis result from the detection signal; an analysis result display configured to display the analysis result; a device control module configured to control the measurement unit and output a control signal; and an abnormality detection module configured to detect noise in the measurement device. The abnormality detection module stores an enable interval of each of the components of the measurement device into a memory resource, and determines, for each of the components of the measurement device, whether the noise is mixed in based on the corresponding enable interval stored in the memory resource and the analysis result from the analysis processing unit.