Material Sample Analysis With Rotatable Radiation Source Switching
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Solution Overview
Problem
Existing devices for analyzing material samples via electromagnetic radiation lack the ability to rapidly and simply switch between different radiation sources, which is essential for efficient and flexible measurement tasks.
Innovation Solution
A device with a rotatable deflection element that can selectively direct electromagnetic radiation from multiple radiation sources onto a material sample, allowing for rapid switching and redundant illumination, and incorporating beam shaping and validation elements for precise measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple radiation sources are provided for analyzing material samples, then the versatility and adaptability of the device is improved, but the complexity of switching between sources and the time required for source changes increases
Solution Approach 1:
The patent employs a rotatable deflection element (mirror or prism) that can dynamically change orientation to direct radiation from different sources onto the sample. This dynamic switching mechanism allows rapid transition between radiation sources without mechanical repositioning of the sources themselves, thereby reducing switching time while maintaining versatility
Solution Approach 2:
The deflection element serves multiple functions: it directs radiation from different sources, shapes the radiation beam, and can be positioned to block or allow specific radiation paths. This multi-functional component enables a single device to handle multiple radiation sources and measurement configurations without requiring separate switching mechanisms for each function
2Ease of operation
If a rotatable deflection element is used to direct radiation from multiple sources, then the ease of operation and speed of switching is improved, but the device complexity increases
Solution Approach 1:
The patent combines the deflection function, beam shaping function, and source selection function into a single rotatable deflection element. By merging these functions into one component rather than using separate elements for each function, the overall device complexity is reduced while maintaining ease of operation
Solution Approach 2:
The radiation sources are arranged along a circular arc around the sample position, with the rotatable deflection element positioned at the center of this arc. This geometric arrangement allows the deflection element to access and direct radiation from all sources along the arc through simple rotation, simplifying the switching mechanism while enabling access to multiple sources
3Speed
If radiation sources are arranged on a circular arc around the deflection element, then the speed and simplicity of source switching is improved, but the device footprint and spatial requirements increase
Solution Approach 1:
Instead of arranging radiation sources in a linear fashion or stacking them vertically, the patent utilizes a circular arc arrangement in the horizontal plane around the sample. This spatial arrangement allows the rotatable deflection element to access multiple sources through rotation in two dimensions, enabling fast switching while efficiently utilizing the available space around the sample position
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and flexible switching between radiation sources, ensuring optimal illumination and measurement accuracy, even in challenging environments, and supports redundant operation to maintain measurement integrity.
Implementation Method 1
a deflection element for deflecting this radiation onto a material sample
Implementation Method 2
at least one detector for detecting the electromagnetic radiation emanating from the material sample
Data Source
AI summary
A device for analysing material samples by means of electromagnetic radiation. The device comprises an illumination device with at least two radiation sources for generating the electromagnetic radiation, and a deflection element for deflecting the electromagnetic radiation onto the material sample. Furthermore, at least one detector is provided for detecting the electromagnetic radiation emitted by the material sample. The deflection element is designed to be rotatable about an axis parallel to the direction of propagation of the deflected radiation and is movable in such a way that the material sample can be selectively exposed to radiation from one of the radiation sources. Advantageously, the deflection element is designed as a mirror, for example as a concave mirror.