Building Material Scanning for Standardized Condition Assessment
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Solution Overview
Problem
Traditional methods for assessing the condition of building substrates and materials are inefficient, inaccurate, and lack standardization, leading to late detection of degradation, high maintenance costs, and unpredictability in timing and costs.
Innovation Solution
A system utilizing scanning devices with sensors and control devices, including processors and memory, to capture data on building substrates and determine their condition through scanning patterns, sensor data analysis, and comparison to baseline values, aided by machine learning and AI for predictive maintenance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional manual inspection methods are used to assess substrate condition, then device complexity is low, but measurement precision and detection accuracy are poor
Solution Approach 1:
The patent replaces manual mechanical inspection methods with an automated scanning system that uses optical sensors, cameras, and LIDAR to detect substrate conditions. This substitution enables precise measurement of substrate integrity, moisture content, and structural defects without human intervention, significantly improving measurement precision while accepting increased device complexity.
Solution Approach 2:
The patent introduces a control device as an intermediary between the scanning device and the analysis process. The control device coordinates the scanning device, processes sensor data, and generates condition assessments, enabling the complex scanning system to operate efficiently and produce accurate results through centralized mediation.
2Productivity
If traditional inspection methods are used, then device complexity is low, but productivity and inspection efficiency are low
Solution Approach 1:
The scanning device is designed to autonomously navigate and inspect substrates without continuous human control. The device self-manages data collection, the control device automatically processes information, and the system generates condition reports independently, dramatically improving inspection productivity while requiring sophisticated automated systems.
Solution Approach 2:
The system performs preliminary scanning and data collection before detailed analysis is required. The scanning device gathers comprehensive substrate data in advance, allowing for efficient subsequent processing and condition assessment, thereby improving overall inspection productivity through staged information gathering.
3Measurement precision
If no standardized assessment procedure is used, then ease of operation is high, but measurement precision and assessment accuracy are poor
Solution Approach 1:
The patent establishes standardized assessment procedures that define specific parameters for evaluating substrate conditions, such as structural integrity thresholds, moisture content limits, and defect classification criteria. These standardized parameter changes enable consistent, accurate assessments across different inspections while providing clear operational guidelines that maintain ease of use through systematic evaluation frameworks.
Data Source
AI summary
A system for assessing condition of materials. The system includes a scanning device including a scanning vehicle and one or more scanning sensors and a control device in electronic communication with the scanning device. The control device includes one or more processors and a memory containing processor-executable instructions that, when executed by the one or more processors, cause the one or more processors to transmit instruction to the scanning vehicle to move with respect to a structure, transmit instructions to the one or more scanning sensors to capture data associated with one or more materials of the structure, receive sensor data from the one or more scanning sensors, and, based on the sensor data, determine a condition of each of the one or more materials of the structure.