Matter-Wave Angle Measurement in Tight Spaces Without Contact
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Solution Overview
Problem
Existing angle measurement tools face limitations such as requiring long base lines, manual alignment, contact mode, complex optical alignment, and low accuracy, making them unsuitable for precise measurements in small spaces or for microscopic applications.
Innovation Solution
A non-contact angle measuring apparatus utilizing matter-wave and energy (MWE) particles to generate and detect interference patterns, allowing for precise angle measurement between plane surfaces without physical contact or complex alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional contact angle measurement tools are used, then measurement can be performed with simple equipment, but measurement precision is low and manual alignment is required
Solution Approach 1:
The patent replaces traditional mechanical contact-based angle measurement systems with a matter-wave interference-based measurement system. Instead of using physical probes and optical alignment mechanisms, the invention uses matter-wave particles (such as electrons or neutrons) that generate interference patterns when interacting with the surface being measured. The angle is determined by analyzing the interference pattern, eliminating the need for complex mechanical alignment and contact mechanisms while achieving nanometer-scale precision.
2Measurement precision
If long base lines are used for angle measurement, then measurement accuracy improves, but the apparatus cannot be used in small spaces
Solution Approach 1:
The patent transitions from traditional spatial baseline measurement to a wave-based measurement approach. Instead of requiring a long physical baseline in one dimension, the invention uses the wave nature of matter particles to create interference patterns that encode angular information. The interference pattern's spatial frequency contains the measurement information, effectively compressing the measurement capability into a compact apparatus that can operate in small spaces while maintaining high precision through the wave phenomenon rather than physical dimension.
3Productivity
If manual alignment procedures are used, then device operation is simple to understand, but measurement time increases and productivity decreases
Solution Approach 1:
The patent implements a self-aligning measurement system where the matter-wave interference pattern automatically forms based on the geometry of the surface being measured. The system does not require manual alignment of optical components or mechanical fixtures. The matter waves naturally interact with the surface features and generate interference patterns that directly encode the angular information. The detector automatically captures and processes these patterns, providing rapid measurements without human intervention in the alignment process, thereby significantly improving productivity while maintaining ease of use.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-precision, automated angle measurement at the nano-meter scale or sub-atomic level, overcoming the limitations of traditional methods by using MWE particles to determine angles with improved accuracy and flexibility.
Implementation Method 1
detecting a plurality peaks or valleys of an interference pattern generated by the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and matter waves associated with (or coherent) the boson or fermion particles reflected by a second plane
Implementation Method 2
the newly discovered embodiments which are associated with matter wave property of the fundamental particles such as bosons (e.g. photon) and/or fermions (e.g. electron, neutron)
Data Source
AI summary
A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.