MBIST Data Structure for Customizable DFT Insertion
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Solution Overview
Problem
As integrated circuit (IC) chip designs become increasingly complex, existing Memory Built-In Self Test (MBIST) architectures face challenges in efficiently incorporating customer-specific arrangements, particularly in system test partitioning and voltage islands, requiring improved methods for Design For Test (DFT) insertion.
Innovation Solution
A data structure and system that allow for the description and generation of a Memory Built-In Self Test (MBIST) design file, utilizing an Organization File (Org File) to define associations between MBIST components and hierarchical test ports, and specify the serial order of daisy chains within the design level, enabling the implementation of a customer-specific MBIST architectural arrangement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If MBIST architectures are customized for each customer's specific needs and complex design hierarchies, then adaptability and test effectiveness are improved, but device complexity and implementation difficulty increase
Solution Approach 1:
The patent segments the MBIST configuration process into distinct hierarchical levels (top-level design, module-level design, and component-level design). Each level has its own organization file that describes only the MBIST arrangements relevant to that level, allowing complex customizations to be broken down into manageable segments that can be independently configured and processed.
Solution Approach 2:
The patent introduces organization files as intermediary data structures between the customer's design requirements and the MBIST implementation. These files serve as a standardized interface that captures custom MBIST arrangements (such as voltage island partitions, fuse partitions, and memory sharing configurations) and translates them into actionable configuration data for the design tool, mediating between high-level customization needs and low-level implementation details.
2Adaptability or versatility
If manual configuration methods are used for complex MBIST arrangements, then flexibility in customization is maintained, but time consumption and productivity decrease
Solution Approach 1:
The patent enables preliminary configuration of MBIST arrangements by allowing customers to define their desired MBIST architectural arrangements (such as partitioning schemes and component associations) in organization files before the actual DFT insertion process. The design tool then automatically processes these pre-defined configurations, eliminating the need for manual step-by-step configuration during implementation and significantly improving productivity.
Solution Approach 2:
The patent transforms the complex process of MBIST configuration into parameter-based definitions within organization files. Customers specify MBIST arrangements by defining parameters such as partition boundaries, component associations, and daisy chain configurations in a structured data format. The design tool automatically interprets these parameters and generates the appropriate MBIST implementation, converting manual customization efforts into automated parameter-driven configuration.
3Reliability
If comprehensive MBIST component associations and hierarchical test port connections are described, then test coverage and reliability are improved, but data structure complexity and processing requirements increase
Solution Approach 1:
The patent resolves data structure complexity by organizing MBIST component associations and test port connections across multiple hierarchical dimensions. Instead of representing all relationships in a single flat structure, the patent uses nested organization files at different hierarchical levels, where each level describes associations within its scope. This multi-dimensional organization allows comprehensive test coverage to be achieved while keeping each individual data structure relatively simple and manageable.
Data Source
AI summary
A system and associated data structure that can be utilized within a chip design platform to define the structure of an MBIST architecture. A system for generating a memory built in self test (MBIST) design file in described, including a tool for processing an organization file (Org File), wherein the Org File includes lines of code that dictate a structure of the MBIST design file and conform to a data structure defined by the tool; wherein said data structure provides an infrastructure to describe: associations between MBIST components at a design level; associations between MBIST components and hierarchical test ports at the design level; and a serial order of daisy chains among MBIST components within the design level.