MBIST Logic Modification via RTL Change Strategy
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Solution Overview
Problem
Designers face challenges in modifying existing memory built-in self-test (MBIST) logic at the register transfer level (RTL) due to lack of sufficient information, leading to significant time loss and inefficiency in updating MBIST logic when RTL changes occur, as current methods require reverting to a design without MBIST logic or comparing designs, which is difficult and often avoided.
Innovation Solution
A system, method, and computer-accessible medium that determine the location of MBIST logic, remove, modify, and reinsert MBIST logic based on RTL changes, using pattern control files and Test Data Register mapping files, allowing for line-by-line analysis and hierarchical name references to manage MBIST logic modifications without requiring specific knowledge of its location.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If designers revert to a design without MBIST logic to locate and modify MBIST logic, then they can access the original design structure, but significant time is lost due to the design being far removed from the current state
Solution Approach 1:
The patent introduces an intermediary file (such as a constraint file or metadata file) that stores information about MBIST logic locations and characteristics. This intermediary serves as a mediator between the current RTL design and the MBIST logic, allowing designers to quickly locate and modify MBIST without reverting to original designs. The intermediary file contains references or markers that point to MBIST logic positions in the current design state.
2Manufacturing precision
If designers use a strategy to compare current design with new MBIST logic to generate a change list, then they can identify modifications needed, but the task becomes difficult and is generally avoided
Solution Approach 1:
The patent applies preliminary action by pre-processing the RTL design to automatically identify and mark MBIST logic locations before modification is needed. The system performs preliminary analysis to generate information about MBIST logic positions, characteristics, and dependencies in advance. This preliminary information is stored and can be quickly retrieved when modifications are needed, avoiding the complex comparison process entirely.
3Ease of operation
If sufficient information about MBIST logic location is provided at RTL level, then designers can easily modify MBIST logic, but this information is generally not available in the current design process
Solution Approach 1:
The patent segments the design information into separate components, specifically extracting MBIST logic location and characteristic information from the overall RTL design. This segmentation creates a dedicated information structure for MBIST logic that can be independently accessed and modified. The MBIST logic information is separated into identifiable units (such as markers, comments, or separate data structures) within the RTL code, making it easily locatable and modifiable without affecting other design elements.
Data Source
AI summary
An exemplary system, method, and computer-accessible medium for modifying a memory unit(s) may be provided, which may include, for example, determining a location of a first memory built-in self-test (MBIST) logic(s) in the memory unit(s), removing the first MBIST logic(s) from the memory unit(s), and inserting a second MBIST logic(s) into the memory unit(s) at the location. The second MBIST logic(s) may be based on the first MBIST logic(s). The second MBIST logic(s) may be generated, which may be performed by modifying the first MBIST logic(s). The first MBIST logic(s) may be modified based on a modification(s) to a register transfer level (RTL) list associated with the memory unit(s). A pattern control file or a Test Data Register mapping file may be modified based on the modification to the first MBIST logic(s).