Memory Built-In Self-Test Resource Allocation
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Solution Overview
Problem
Memory devices face challenges in efficiently allocating resources for built-in self-testing (MBIST) without compromising standard memory operations, often resulting in either under-provisioning or over-provisioning of resources, which affects performance and reliability.
Innovation Solution
A method where a host device identifies and allocates specific memory resources for MBIST by transmitting a mode register write command, allowing the memory device to use additional resources for testing while ensuring these resources are not available for standard operations, thereby optimizing resource utilization without increasing the device size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If memory resources are allocated for MBIST, then testing capability is improved, but resources for standard memory operations are reduced
Solution Approach 1:
The patent implements dynamic resource allocation where memory resources are allocated to MBIST based on operational conditions. The system can switch between different resource allocation states depending on whether the memory device is performing standard operations or MBIST, allowing optimal resource utilization for each mode without permanent sacrifice of capacity.
Solution Approach 2:
The patent employs periodic allocation of memory resources to MBIST, where resources are temporarily assigned during test cycles and then returned to standard operations. This periodic switching allows the system to maintain full resource capacity for productive operations while periodically dedicating resources to testing, resolving the contradiction between testing capability and operational capacity.
2Reliability
If additional memory resources are provisioned for MBIST, then testing thoroughness is improved, but device size increases
Solution Approach 1:
The patent makes existing memory resources multi-functional by allowing them to serve both standard memory operations and MBIST functions. The same memory cells and associated circuitry are used for productive operations during normal modes and for testing during MBIST modes, eliminating the need for dedicated additional resources and avoiding device size increase.
Solution Approach 2:
The patent implements self-service where the memory device uses its own existing resources to perform self-testing. Rather than requiring external testing equipment or additional dedicated test resources, the memory device allocates and manages its own resources for MBIST, achieving thorough testing without increasing device size.
Data Source
AI summary
Implementations described herein relate to resource allocation for a memory built-in self-test. A memory device may read one or more bits, associated with a memory built-in self-test, that are stored in a mode register of the memory device. The memory device may identify one or more memory resources of the memory device, based on reading the one or more bits, that are to be used for performing the memory built-in self-test. The one or more memory resources of the memory device may be addressable memory resources configured for performing standard memory operations of the memory device. The memory device may perform the memory built-in self-test for the memory device using the one or more memory resources of the memory device.