Multipath Interference Analysis Using Measured Fiber Splice Distributions

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Solution Overview

Problem

Existing multipath interference analysis methods struggle with variations in splice loss and cutoff wavelength, leading to overestimation of multipath interference and unnecessary costs in optical transmission line equipment.

Innovation Solution

A multipath interference analysis device that calculates a normal distribution of splice loss and cutoff wavelength, truncates it to predetermined limits, generates random numbers for fiber piece selection, and calculates MPI values using mode-dependent loss, reducing the estimated MPI value.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If worst-case analysis is used to estimate multipath interference, then reliability of optical transmission is improved, but device complexity and cost increase due to excessive equipment installation

Engineering Contradiction:
Improveoptical transmission reliabilityVSAvoidequipment installation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent changes the estimation parameters from fixed worst-case values to statistically distributed values representing actual field conditions. By using measured distributions of splice loss and cutoff wavelength from multiple optical fiber pieces, the analysis transitions from conservative worst-case assumptions to realistic parameter ranges, reducing overestimation of MPI while maintaining transmission reliability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates virtual copies of actual optical fiber pieces through statistical modeling. By measuring and recording the splice loss and cutoff wavelength of multiple physical fiber pieces, then using these measured values as input distributions for Monte Carlo simulation, the system replicates real-world variability without requiring physical prototypes or excessive safety margins

Inventive Principle:
Principle #26Copying

2Manufacturing precision

If statistical analysis with measured values is used, then manufacturing precision is improved, but measurement precision requirements increase

Engineering Contradiction:
Improveoptical fiber manufacturing precisionVSAvoidsplice loss and cutoff wavelength measurement precision
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent performs preliminary measurements of splice loss and cutoff wavelength on multiple optical fiber pieces before the actual MPI analysis. By pre-characterizing the statistical distributions of these parameters through systematic measurement campaigns, the methodology captures manufacturing variability upfront, allowing subsequent simulations to use realistic input distributions without requiring ultra-precise measurements during the analysis phase

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12463724B2Multipath interference analysis device and multipath interference analysis method
Publication Date: 2025.11.04 NT T INC
  • US12463724B2 patent drawing
  • US12463724B2 patent drawing
  • US12463724B2 patent drawing

AI summary

A multipath interference analysis device includes a statistical amount calculation unit that calculates statistical amounts of respective measurement values of splice loss measured from a plurality of optical fiber pieces for forming an optical transmission line, and measurement values of cutoff wavelength, a determination unit that determines a truncated normal distribution from a normal distribution of the cutoff wavelength, a random number generation unit that generates random numbers for selecting a predetermined number of pieces of splice connection targets of the optical transmission line, and an MPI value calculation unit that calculates an MPI value using a mode dependent loss of a fundamental mode of the optical transmission line formed of each piece selected according to the random numbers, and a splice interval.