Measurement Apparatus for Simultaneous High Frequency and DC Parameter Analysis

Solution Overview

Problem

Conventional measurement setups for devices under test require separate devices for high frequency and DC characteristic measurements, leading to increased complexity and inability to perform simultaneous measurements, making it difficult to recognize dependencies between high frequency and low frequency parameters.

Innovation Solution

A measurement apparatus combining a high frequency measurement unit and a multimeter unit that can measure high frequency parameters and DC characteristics simultaneously, with a control bus interface for data linkage, allowing for simultaneous measurement and display of both parameters, along with a data evaluation unit for correlation analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If separate measurement devices are used for high frequency parameters and DC characteristics, then measurement functionality is provided, but device complexity increases and measurement time increases

Engineering Contradiction:

Improvemeasurement functionalityVSAvoidmeasurement setup complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent combines a network analyzer and a multimeter into a single integrated measurement device. The network analyzer measures high frequency parameters (S-parameters) while the multimeter measures DC characteristics (current, voltage, resistance). Both measurement functions are merged into one device with a unified control interface, eliminating the need for separate measurement devices and reducing setup complexity.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The measurement device is designed with multi-functionality to perform both high frequency parameter measurement and DC characteristic measurement. The device includes a network analyzer unit for S-parameter measurement and a multimeter unit for DC measurements, allowing a single device to replace multiple specialized instruments and provide comprehensive measurement capabilities.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If separate measurement devices are used for high frequency parameters and DC characteristics, then measurement functionality is provided, but measurement time increases

Engineering Contradiction:

Improvemeasurement functionalityVSAvoidmeasurement speed

Core Design Contradiction:

Adaptability or versatilityVSProductivity

Solution Approach 1:

The patent combines a network analyzer and a multimeter into a single integrated measurement device. The network analyzer measures high frequency parameters (S-parameters) while the multimeter measures DC characteristics (current, voltage, resistance). Both measurement functions are merged into one device with a unified control interface, eliminating the need for separate measurement devices and reducing setup complexity.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The integrated measurement device enables simultaneous or continuous measurement of both high frequency parameters and DC characteristics without interruption. The device can perform S-parameter measurements and DC measurements in parallel or sequentially without requiring device switching or setup changes, maintaining continuous measurement action and reducing total testing time.

Inventive Principle:

Principle #20Continuity of useful action

3Adaptability or versatility

If separate measurement devices are used for high frequency parameters and DC characteristics, then measurement functionality is provided, but dependency analysis becomes difficult

Engineering Contradiction:

Improvemeasurement functionalityVSAvoidparameter dependency information

Core Design Contradiction:

Adaptability or versatilityVSLoss of information

Solution Approach 1:

The patent combines a network analyzer and a multimeter into a single integrated measurement device. The network analyzer measures high frequency parameters (S-parameters) while the multimeter measures DC characteristics (current, voltage, resistance). Both measurement functions are merged into one device with a unified control interface, eliminating the need for separate measurement devices and reducing setup complexity.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The integrated measurement device includes a data evaluation unit that collects measurement data from both the network analyzer and multimeter, processes the data, and provides feedback on the relationships between high frequency parameters and DC characteristics. This feedback mechanism enables automatic correlation analysis and presents the dependencies in a comprehensible form, preventing loss of information about parameter relationships.

Inventive Principle:

Principle #23Feedback

Data Source

PatentUS10591522B2Measurement apparatus

Publication Date: 2020.03.17 ROHDE & SCHWARZ GMBH & CO KG

AI summary

A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).