3D Measurement Edge Overlap Detection for Speed
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Solution Overview
Problem
Current three-dimensional shape measurement methods face challenges in achieving high-speed measurement due to issues with signal noise ratio, indirect reflection, and increased noise from object inclination, which affect the reliability of measurement lines and require frequent image capturing, making high-speed measurement difficult.
Innovation Solution
A three-dimensional measurement apparatus that includes an obtaining unit for capturing images of an object with a light and dark stripe pattern, an edge position detecting unit to identify the boundary between light and dark portions, and a position computing unit that calculates object positions based on edge positions and overlap degrees, allowing for high-speed measurement by reducing the need for frequent image capturing and improving signal reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If the light section method is used for three-dimensional shape measurement, then the measurement can be performed using compact components, but the number of captured images increases significantly, reducing measurement speed
Solution Approach 1:
The patent divides the measurement space into multiple regions and assigns different stripe patterns to different regions. This segmentation allows simultaneous measurement of multiple regions with fewer captured images, improving measurement speed while maintaining the use of compact light section components.
Solution Approach 2:
The patent introduces a spatial dimension by projecting stripe patterns at different positions and angles onto the measurement object. This dimensional approach enables encoding of three-dimensional shape information in two-dimensional captured images, reducing the number of images needed while maintaining measurement accuracy.
2Productivity
If the space encoding method is used to reduce the number of captured images, then measurement speed improves, but the spatial resolution is limited by quantization bits
Solution Approach 1:
The patent segments the measurement space into multiple regions and applies different stripe patterns to each region. This segmentation enables high-resolution measurement in each local region while maintaining fast measurement speed overall, overcoming the quantization limitation of global space encoding.
Solution Approach 2:
The patent applies different stripe pattern densities to different spatial regions based on measurement requirements. Regions requiring higher resolution receive denser stripe patterns, while other regions use coarser patterns, optimizing both resolution and measurement speed locally rather than uniformly across the entire measurement space.
3Measurement precision
If special light patterns are used to correct indirect light influences, then measurement accuracy improves, but the complexity of the measurement system increases
Solution Approach 1:
The patent extracts and removes indirect light components from the captured images through image processing techniques. By separating direct reflection (measurement lines) from indirect reflection (noise), the system maintains measurement accuracy without requiring complex optical correction components.
Solution Approach 2:
The patent uses the captured image information itself to identify and correct indirect light influences. By analyzing the captured images and detecting measurement lines through edge detection algorithms, the system provides feedback to distinguish true measurement lines from false ones caused by indirect reflection, maintaining accuracy without additional hardware complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus enables high-speed and accurate three-dimensional shape measurement by reducing noise and improving signal reliability, eliminating the need for special light patterns to correct indirect light influences, thus maintaining image capturing speed similar to ordinary space encoding methods.
Implementation Method 1
projection unit that projects a light and dark stripe pattern on the object
Implementation Method 2
image capturing unit that captures an image of the object on which the light and dark stripe pattern is projected
Data Source
AI summary
On the basis of captured images at the time of projecting multiple-frequency slit-shaped light patterns having no overlapping edge positions onto an object, the edge portions of the slit-shaped light patterns are identified. When the edge portions overlap in the captured images of two or more slit-shaped light patterns, the reliability of the computed distance values of the positions corresponding to the edges is lowered.