Measurement Probe Rack Magnetic Sensing for CMM Deflection Compensation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional coordinate measuring machines (CMMs) face inaccuracies due to probe deflection caused by ambient temperature changes and probe rack weight distribution, leading to unreliable measurements.
Innovation Solution
A measurement probe rack weight compensation system using magnetic sensors to emit signals based on probe disposition, with a reader converting these signals into positional offsets, allowing the CMM to adjust the target position and compensate for probe rack deflections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If magnetic sensors and readers are added to detect probe disposition, then measurement accuracy is improved, but device complexity increases
Solution Approach 1:
The patent replaces complex mechanical weight sensing systems with magnetic field-based detection. Magnetic sensors and readers detect the disposition of measurement probes through magnetic signals, eliminating the need for mechanical load cells or force sensors while achieving accurate weight compensation and position detection.
Solution Approach 2:
The patent introduces magnetic fields as an intermediary between the probe rack system and the detection mechanism. Magnetic sensors detect probe disposition by sensing magnetic field changes caused by probe positions, providing indirect but accurate measurement without direct mechanical contact or complex sensing infrastructure.
2Reliability
If probe rack deflection compensation is implemented, then measurement reliability is improved, but system complexity increases
Solution Approach 1:
The patent implements a feedback mechanism where magnetic sensors continuously detect probe disposition, the system calculates positional offsets based on detected positions, and the CMM adjusts target positions accordingly. This closed-loop feedback ensures measurement reliability by compensating for rack deflections in real-time.
Solution Approach 2:
The patent performs preliminary detection of probe disposition using magnetic sensors before measurements begin. The system pre-calculates positional offsets based on detected probe positions and rack weight distribution, preparing compensation data in advance to ensure measurement reliability without adding complexity during the measurement process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances measurement accuracy by compensating for probe rack deflections, ensuring precise and reliable measurements across varying ambient temperatures and probe distributions.
Implementation Method 1
The active portion uses magnetic induction to produce the magnetic signal received by the passive portion
Data Source
AI summary
A measurement probe rack weight compensation system for a coordinate measurement machine may include a probe rack including rack ports for storing one or more measurement probes, the probe rack including a plurality of magnetic sensors, each configured to emit a magnetic signal in response to receipt of a magnetic field. The magnetic signal is based on a disposition of measurement probes in the rack ports. The rack ports have a plurality of positional offsets based on a plurality of disposition of measurement probes in the rack ports.


