Measurement System Sensor Configuration via Register Maps
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Solution Overview
Problem
Configuring a measurement system to interface with various sensors is challenging, especially for developers with software expertise, as it requires selecting and arranging appropriate sensors, converters, and devices from a wide range of options, leading to potential errors and inaccuracies if not properly calibrated or configured.
Innovation Solution
A measurement system that supports a broad range of sensors and is configurable via a tool-assisted process, allowing for advanced sensor selection and configuration, with features to enable complex processing using simplified hardware and software arrangements, including dynamic data structure allocation and automatic recalibration based on register maps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a broad range of sensors and configuration options are provided, then adaptability and versatility are improved, but device complexity increases
Solution Approach 1:
A configuration tool acts as an intermediary between the developer and the measurement system, automatically generating register maps and configuration settings. This mediator handles the complexity of sensor selection and parameter configuration, allowing developers to work with high-level specifications while the tool manages the detailed technical complexity.
Solution Approach 2:
The measurement system performs self-configuration through automatic register map generation and self-calibration capabilities. The system can automatically detect sensor types, generate appropriate configuration parameters, and perform calibration routines without requiring manual intervention, thereby reducing the perceived complexity for users while maintaining high adaptability.
2Manufacturing precision
If manual configuration is required for sensor selection and arrangement, then manufacturing precision can be controlled, but ease of operation deteriorates
Solution Approach 1:
The configuration tool incorporates feedback mechanisms that validate sensor selections, check configuration parameter consistency, and provide guidance to developers. The system verifies that selected sensors are compatible with the intended measurement tasks and automatically adjusts configuration parameters to ensure accuracy, maintaining manufacturing precision while improving ease of operation.
Solution Approach 2:
The system performs preliminary configuration actions by pre-generating register maps, pre-validating sensor compatibility, and pre-configuring optimal measurement parameters before the actual measurement process begins. This preliminary setup ensures configuration accuracy is established upfront, reducing the need for manual adjustment while making the overall process easier to operate.
3Productivity
If dynamic data structure allocation is implemented, then processing efficiency is improved, but device complexity increases
Solution Approach 1:
The measurement system implements dynamic data structure allocation that adapts memory usage based on the specific sensor configuration and measurement requirements. Rather than using fixed-size buffers, the system dynamically allocates memory structures to match the actual data needs, improving processing efficiency by eliminating wasted memory operations while the underlying complexity is managed through automated memory management routines.
Data Source
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AI summary
Various examples are directed to systems and methods for managing a sensor. A measurement system (102) may receive (402), from a host device (104), a first register map (126) describing a first configuration of a measurement system. The first configuration may be associated with a first sensor (118A, 118B, 118N). The measurement system may compare (404) the first register map to an error rule set indicating inconsistent register map arrangements. After comparing the first register map to the error rule set, the measurement system may configure a switch matrix (116) of the measurement system to sample the first sensor according to the first configuration of the measurement system. The measurement system may receive a plurality of samples from a first sensor and generate first digital measurement data based at least in part on the plurality of samples.