Measuring Chip Diffracted Light Pattern Analysis
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Solution Overview
Problem
Conventional surface plasmon resonance measuring devices require expensive advanced angle detectors and temperature controllers to accurately detect slight angular changes and temperature-induced shifts, making them costly and complex.
Innovation Solution
A measuring chip with a reactor that changes the complex amplitude distribution of light perpendicular to its propagation direction, using a reactant disposed in a patterned manner to detect changes in refractive index, allowing for simpler and more accurate measurements by analyzing diffracted light patterns without the need for advanced angle detectors or temperature control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If surface plasmon resonance measurement is performed to detect slight angular changes, then measurement precision is improved, but device complexity and cost increase due to requiring advanced angle detectors and temperature controllers
Solution Approach 1:
The patent replaces the conventional surface plasmon resonance method (which requires mechanical angle detection systems) with a diffraction-based optical measurement system. Light is introduced at a fixed angle into a waveguide, and measurements are performed by detecting changes in the output light intensity and pattern, eliminating the need for complex mechanical angle detectors and temperature control systems while maintaining measurement precision
Solution Approach 2:
The patent changes the measurement parameter from angular detection to optical intensity and pattern detection. By introducing light at a fixed angle and measuring the output light characteristics (intensity, wavelength, pattern) after interaction with the analyte, the system achieves precise measurements without requiring complex angle detection equipment or temperature control
2Measurement precision
If surface plasmon resonance measurement is performed to detect slight angular changes, then measurement precision is improved, but device cost increases due to requiring advanced angle detectors and temperature controllers
Solution Approach 1:
The patent replaces expensive mechanical angle detectors and temperature control systems with a simple fixed-angle light introduction system and optical detector. This substitution dramatically reduces device cost while maintaining measurement precision by measuring output light intensity and pattern changes instead of angular variations
Solution Approach 2:
The patent employs a disposable or easily replaceable waveguide chip that contains the reactant and performs the measurement function. This approach reduces the cost of the main measurement system by transferring the functional complexity to a low-cost, consumable component that can be manufactured using standard microfabrication techniques
3Measurement precision
If fine adjustment of incoming angle and outgoing angle of light is performed to achieve accurate measurement, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent performs preliminary alignment by introducing light at a predetermined fixed angle into the waveguide structure. The waveguide and optical components are pre-configured to accept light at this specific angle, eliminating the need for real-time angle adjustment and detection during measurement, thus simplifying the device while maintaining precision
Solution Approach 2:
The patent designs the waveguide and optical system to perform multiple functions: it guides light, interacts with the analyte through the reactant, and produces a measurable output pattern, all within a single integrated structure. This multi-functionality eliminates the need for separate angle adjustment mechanisms and detectors, reducing device complexity while maintaining measurement capability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables simpler, highly accurate measurements by detecting changes in refractive index through diffracted light patterns, improving sensitivity and reducing costs by eliminating the need for advanced angle detectors and temperature controllers.
Implementation Method 1
Light introduced into the incoming part propagates while totally reflecting within a measuring chip
Implementation Method 2
the change of the complex amplitude distribution in the reflection (e.g., a phase shift amount or an amplitude change amount) may become different
Implementation Method 3
a change in a complex refractive index of the vicinity of the propagating part due to a reaction between the to-be-detected substance and the reactant
Implementation Method 4
the beam pattern of light emitted from the outgoing part may change (e.g., in a far field). For example, if a Gaussian beam is introduced into the incoming part, the light emitted from the outgoing part may result in diffracted lights
Data Source
Figure 1
Figure 2
Figure 3(A)~3(E)
AI summary
Provided is a measuring chip, a measuring device and a measuring method, which are capable of performing a more simple and highly accurate measurement than the conventional measurement. Light introduced into an incoming part 11 may propagate while totally reflecting within a propagating part 13 of a propagation layer 101. A phase shift amount in the total internal reflection may be different between sections of an upper surface of the propagation layer 101 where a ligand 102 is formed and where a ligand 102 is not formed. When an analyte 201 is adsorbed to the ligand 102, the phase shift amount in the reflection may become larger than before attaching the analyte 201. As a result, a beam pattern of the light outputted from an outgoing part 17 may change.