Measuring Device Applicability Assessment with Digital Machine Models
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Solution Overview
Problem
Existing diagnostic systems for monitoring rotating components in machines struggle with accurate and precise condition diagnosis due to incomplete digital information about component variants, requiring manual parameterization and lacking absolute condition statements, especially for systems with diverse product ranges.
Innovation Solution
A method using an electronic computing device to create a digital reference model for a reference measuring device, specifying a digital model of the machine system, determining an accuracy value, and assessing the applicability of the measuring device based on this model, considering parameters like power, damage type, and positioning, to ensure high measurement accuracy across various products.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual parameterization is used for each product variant, then measurement accuracy can be maintained for specific products, but the effort and time required increases significantly for diverse product ranges
Solution Approach 1:
The patent creates a digital twin (virtual model) of the physical machine system that replicates its characteristics and behavior. This digital copy allows for virtual parameterization and testing, eliminating the need for manual parameterization of each physical product variant while maintaining measurement accuracy through the virtual model.
Solution Approach 2:
The patent automatically adapts parameterization to different product variants by changing parameters based on digital product information. Instead of manual parameterization for each variant, the system automatically adjusts parameters according to the specific product characteristics stored in the digital model, reducing time effort while maintaining accuracy.
2Device complexity
If sensor systems are parameterized for specific product groups, then the system complexity is reduced, but measurement accuracy decreases for individual variants
Solution Approach 1:
The patent implements dynamic parameterization where the measurement system automatically adapts its parameters based on the specific product variant being monitored. The system transitions from static group-based parameterization to dynamic variant-specific parameterization, maintaining low complexity through automation while achieving high accuracy for individual variants.
Solution Approach 2:
The system uses digital product information as feedback to automatically adjust parameterization settings. By continuously referencing the digital twin data, the system automatically configures optimal parameters for each specific product variant, resolving the contradiction between simplified grouping and individualized accuracy.
3Adaptability or versatility
If data-driven approaches are used for anomaly detection, then the system can handle diverse products without detailed parameterization, but absolute condition statements cannot be made
Solution Approach 1:
The patent performs preliminary action by creating comprehensive digital twins of all product variants before actual monitoring begins. This pre-established digital knowledge base enables the system to make absolute condition statements immediately, rather than relying on relative anomaly detection, while maintaining versatility across diverse products through the digital model library.
Data Source
Figure 1~2
AI summary
The invention relates to a method for determining the applicability of a measuring device (26) for a machine system (20) by means of an electronic computing device (10), comprising the steps of: providing a digital reference model (12) for a reference measuring device (14) of a reference machine system (16) by means of the electronic computing device (10); specifying a digital model (18) of the machine system (20) by means of the electronic computing device (10); specifying an accuracy value (22) to be maintained for the measuring device (26) by means of the electronic computing device (10); determining an accuracy value (24) for the digital model (18) as a function of the digital reference model (12) by means of the electronic computing device (10);and determining the applicability of the measuring device (26) as a function of the predetermined accuracy value (22) and the determined accuracy value (24) by means of the electronic computing device (10). Furthermore, the invention relates to a computer program product, a computer-readable storage medium, and an electronic computing device (10).