Measuring Device Three-Tier Storage Histogram Formation
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Solution Overview
Problem
Existing measuring devices face challenges in efficiently storing test values without prior knowledge of their probability of occurrence, especially with high-resolution displays and multiple overlapping test curves, leading to significant storage requirements.
Innovation Solution
A measuring device with a three-tiered storage system, where test values are stored in memory cells of varying sizes, with a first region for initial storage, a second region for incremental storage of recurring values, and a third region for overflow, allowing dynamic allocation of memory cells based on need, minimizing unused space.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If a high-resolution display device displays multiple test curves with sufficient storage depth for each pixel, then all test curves can be displayed without loss of information, but the storage requirement becomes very large
Solution Approach 1:
The patent segments the storage system into three distinct storage regions with different storage depths: a first storage region with shallow depth for frequently occurring test values, a second storage region with medium depth for moderately frequent values, and a third storage region with deep depth for rare values. This segmentation allows the system to allocate storage resources efficiently based on actual usage patterns rather than uniformly reserving maximum depth for all pixels, thereby reducing total storage requirements while maintaining complete information retention for display.
Solution Approach 2:
The patent applies local quality by assigning different storage depths to different storage regions based on the local characteristics of test value distributions. Instead of using uniform storage depth across all pixels, the system dynamically allocates deeper storage only to regions where test values actually require it, while using shallower storage for regions with fewer unique values. This localized optimization reduces overall storage requirements while ensuring adequate capacity where needed.
2Quantity of substance
If prior knowledge about probability of occurrence is used to reserve different storage depths, then storage efficiency can be improved, but the method requires prior knowledge which is not always available
Solution Approach 1:
The patent implements a dynamic storage allocation mechanism that automatically adapts to the actual distribution of test values during operation. The system includes control logic that monitors test value occurrences and dynamically determines which storage region to use for each value. This dynamic approach eliminates the need for prior knowledge about probability distributions, as the system learns and adapts to the actual data patterns in real-time, making the solution universally applicable to different test scenarios.
Solution Approach 2:
The storage system performs self-service by automatically analyzing the distribution characteristics of incoming test values and autonomously allocating them to appropriate storage regions without requiring external guidance or pre-programmed probability information. The control logic within the system itself identifies patterns and makes allocation decisions, enabling the system to efficiently adapt to any test value distribution scenario independently.
Data Source
AI summary
A measuring device for the efficient storage of test values and associated addresses provides a first storage region (30) and a second storage region (33). The first storage region (30) comprises a first number of memory cells (32) of a first cell size (31). The second storage region (33) comprises a second number of memory cells (35) of a second cell size (34). The measuring device further provides a third storage region (36) made from a second number of memory cells (38). A memory cell (38) of the third storage region (36) is rigidly assigned to each memory cell (35) of the second storage region (33). A control unit stores test values in the storage regions in a cumulative manner, separated according to addresses, for storing the test values only in the first storage region, if the test value for the respective address does not exceed the first cell size, for storing test values which exceed the first cell size jointly in memory cells of the first storage region and memory cells of the third storage region, and for storing associated addresses of the test values which exceed the first cell size in the corresponding memory cells of the second storage region.