Memory Array Voltage Regulation for Leakage Reduction

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Solution Overview

Problem

Integrated circuits face challenges in reducing leakage currents during low power modes without compromising data integrity, especially as transistor leakage increases with finer geometry manufacturing processes and larger cache memories lead to more leakage paths.

Innovation Solution

An integrated circuit design that includes a memory array with a voltage regulator using N-channel transistors and a bias circuit to elevate the ground connection voltage during standby mode, utilizing dummy edge cells to manage leakage current and track variations due to process, voltage, and temperature changes, thereby reducing power consumption without affecting reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the cache memory size is increased to take advantage of finer geometry manufacturing processes, then the storage capacity is improved, but the number of leakage paths increases resulting in higher leakage current

Engineering Contradiction:
Improvestorage capacityVSAvoidleakage current
Core Design Contradiction:
Quantity of substanceVSLoss of energy

Solution Approach 1:

The cache memory is divided into multiple banks, allowing selective activation. During idle periods, individual banks can be placed in low power mode while others remain active, reducing total leakage current without compromising overall storage capacity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent dynamically adjusts the virtual ground voltage level based on operating conditions. During low power mode, the virtual ground voltage is elevated to a specific level that reduces leakage current while maintaining data integrity in the memory cells.

Inventive Principle:
Principle #35Parameter changes

2Loss of energy

If the virtual ground terminal voltage is increased during low power mode to reduce leakage current, then power consumption is reduced, but data integrity may be compromised if the voltage is not maintained accurately

Engineering Contradiction:
Improvepower consumptionVSAvoiddata integrity
Core Design Contradiction:
Loss of energyVSReliability

Solution Approach 1:

A feedback mechanism monitors the virtual ground voltage level and adjusts it dynamically. The system detects voltage deviations and corrects them in real-time, ensuring the virtual ground voltage remains within the optimal range for leakage reduction while maintaining data integrity.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent introduces a dedicated voltage regulation circuit as an intermediary between the power supply and the memory cells. This circuit acts as a buffer that precisely controls the virtual ground voltage, isolating the memory cells from power supply variations and ensuring stable operation during low power mode.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Device complexity

If traditional power reduction techniques are used, then implementation simplicity is maintained, but they become ineffective as transistor leakage currents increase with finer geometry processes

Engineering Contradiction:
Improveimplementation simplicityVSAvoidleakage current
Core Design Contradiction:
Device complexityVSLoss of energy

Solution Approach 1:

The patent implements dynamic voltage scaling where the virtual ground voltage is adjusted in real-time based on the operational state of the memory. During active modes, the virtual ground remains at standard levels for optimal performance. During idle or low power modes, the virtual ground voltage is elevated to reduce leakage, creating a dynamic adaptation to changing conditions.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS8400819B2Integrated circuit having variable memory array power supply voltage
Publication Date: 2013.03.19 NXP USA INC
  • US8400819B2 patent drawing
  • US8400819B2 patent drawing
  • US8400819B2 patent drawing

AI summary

An integrated circuit comprises a memory array and a bias circuit. The memory array comprises a plurality of memory cells arranged in a grid of rows and columns. A first conductor is coupled to a power supply voltage terminal of each of the plurality of memory cells. A second conductor is coupled to receive a power supply voltage. The memory array also includes a plurality of dummy cells. A transistor of one or more of the plurality of dummy cells has a first current electrode coupled to the first conductor, a second current electrode coupled to the second conductor, and a control electrode. The bias circuit is coupled to the control electrode of the transistor.