Temperature-Compensated Time Estimate for Memory Block Charge Loss

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Solution Overview

Problem

Memory sub-systems face challenges in accurately determining when a block reaches a uniform charge loss state, which is essential for efficient read operations, due to variations in charge loss rates among memory cells.

Innovation Solution

The implementation of a temperature-compensated time estimate and measurement of representative charge losses to determine if a block is in a uniform charge loss state, allowing the memory sub-system controller to adjust read operations accordingly.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the memory sub-system uses a fixed time estimate for charge loss, then the system complexity is reduced, but the accuracy of determining uniform charge loss state deteriorates due to temperature variations

Engineering Contradiction:
Improvesystem complexityVSAvoidaccuracy of determining uniform charge loss state
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies parameter changes by introducing temperature as a variable parameter that modifies the time estimate for charge loss. Instead of using a fixed time estimate, the system adjusts the time estimate based on measured temperature values, allowing the charge loss prediction to adapt to different thermal conditions and thereby improving accuracy without significantly increasing system complexity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements feedback by measuring the actual temperature of the memory block and using this measurement to adjust the time estimate for charge loss. This closed-loop approach allows the system to continuously refine its charge loss predictions based on real-time temperature data, improving the accuracy of determining when a block reaches uniform charge loss state

Inventive Principle:
Principle #23Feedback

2Measurement precision

If the memory sub-system performs frequent charge loss measurements, then the accuracy of read operations is improved, but the resource consumption increases

Engineering Contradiction:
Improveaccuracy of read operationsVSAvoidresource consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies preliminary action by performing charge loss measurements and temperature assessments before executing read operations. By determining the charge loss state in advance and using this information to adjust read parameters, the system improves read accuracy while avoiding the need for frequent measurements during normal operation, thus reducing overall resource consumption

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements partial action by performing charge loss measurements only when necessary - specifically when temperature changes indicate that charge loss conditions have significantly changed. Rather than continuously measuring charge loss, the system performs measurements selectively based on temperature thresholds, achieving adequate accuracy while minimizing resource usage

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves the accuracy and efficiency of read operations by ensuring appropriate compensation for charge loss, reducing errors, and minimizing unnecessary resource consumption.

Implementation Method 1

temperature-compensated time estimate for when a block will reach a uniform charge loss state

Methodology Applied
Scientific EffectTemperature compensation:

Data Source

PatentUS12266420B2Temperature-compensated time estimate for a block to reach a uniform charge loss state
Publication Date: 2025.04.01 MICRON TECHNOLOGY INC
  • US12266420B2 patent drawing
  • US12266420B2 patent drawing
  • US12266420B2 patent drawing

AI summary

A processing device in a memory sub-system monitors a temperature associated with a block of a memory device, the block comprising a plurality of wordlines. The processing device further determines a first amount of time between when memory cells associated with a first wordline of the plurality of wordlines of the block were written and when memory cells associated with a last wordline of the plurality of wordlines of the block were written. That first amount of time is normalized according to the temperature associated with the block. The processing device further determines, based at last in part on the first amount of time and on an associated scaling factor, an estimate of when the block will reach a uniform charge loss state.