Memory Block Family Combining for Voltage Shift Management

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Solution Overview

Problem

Existing memory sub-systems face increased bit error rates due to the temporal voltage shift caused by slow charge loss in memory cells, which current technologies either fail to adequately address or do so inefficiently.

Innovation Solution

The memory sub-system employs block family-based error avoidance strategies by tracking temporal voltage shifts and applying appropriate voltage offsets to base read levels, allowing for efficient read operations by grouping blocks into families based on programming time and temperature, and periodically calibrating and combining block families to reduce metadata overhead.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If block families are tracked and calibrated individually, then bit error rates are reduced, but metadata overhead and resource consumption increase

Engineering Contradiction:
Improvebit error rateVSAvoidmetadata overhead
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent combines multiple block families into a single block family when their voltage metrics are similar, reducing the number of separate calibrations needed. This merging approach maintains reliability by grouping blocks with comparable characteristics while reducing metadata overhead by consolidating calibration data.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent creates a unified block family structure that can serve multiple calibration groups, allowing a single calibration profile to be applied universally to all blocks within the combined family. This multi-functional approach reduces the need for separate calibration data structures for each individual block family.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If voltage offsets are applied to compensate for temporal voltage shift, then read accuracy improves, but energy consumption increases

Engineering Contradiction:
Improveread accuracyVSAvoidenergy consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent dynamically adjusts voltage offsets based on the age of blocks and their specific voltage metrics rather than applying uniform offsets to all blocks. This parameter-based approach maintains read accuracy by compensating for temporal voltage shift only where necessary, reducing overall energy consumption compared to universal offset application.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent applies voltage offset compensation selectively to only those blocks that require it based on their age and voltage characteristics, rather than applying compensation to all blocks uniformly. This partial action approach maintains necessary read accuracy while minimizing unnecessary energy expenditure on blocks that don't require compensation.

Inventive Principle:
Principle #16Partial or excessive action

3Manufacturing precision

If periodic calibration is performed on all block families, then voltage accuracy is maintained, but time and computational resources are wasted

Engineering Contradiction:
Improvevoltage accuracyVSAvoidcalibration time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent implements periodic calibration only for block families that have aged beyond a certain threshold or show signs of voltage drift, rather than calibrating all block families at fixed intervals. This selective periodic action maintains voltage accuracy for blocks that need it while avoiding unnecessary calibration operations on stable blocks.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent enables the memory system to automatically identify which block families require calibration based on their age and voltage metrics, performing calibration only when necessary. This self-service approach maintains voltage accuracy by letting the system monitor and calibrate itself selectively, reducing time and computational resource waste compared to mandatory periodic calibration of all blocks.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11768619B2Voltage based combining of block families for memory devices
Publication Date: 2023.09.26 MICRON TECHNOLOGY INC
  • US11768619B2 patent drawing
  • US11768619B2 patent drawing
  • US11768619B2 patent drawing

AI summary

An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to identify a first block family comprising a first set of blocks, wherein the first block family comprises a plurality of blocks that have been programmed within at least one of a specified time window or a specified temperature window; identify a second block family comprising a second set of blocks; and responsive to a determining that a threshold criterion is satisfied, combine the first block family and the second block family by appending, to first block family metadata of the first block family, a record referencing the second set of blocks.