Memory Block Temperature Tracking for Read Failure Classification

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing storage devices register memory blocks as bad blocks due to temporary read failures caused by internal temperature fluctuations, leading to unnecessary consumption of reserved blocks and waste of storage space.

Innovation Solution

Implement a temperature sensor to measure program and read attempt temperatures, and a controller to determine if the temperature difference falls within a guaranteed range, registering blocks as bad or refresh candidates based on these measurements to avoid unnecessary block replacement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a memory block that has failed to read is uniformly registered as a bad block, then data loss is prevented, but storage space is wasted and reserved blocks are consumed unnecessarily

Engineering Contradiction:
Improvedata loss preventionVSAvoidstorage space
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent introduces temperature as a critical parameter to differentiate between temporary and permanent read failures. By measuring program temperature and read attempt temperature, the system changes the decision parameter from a binary read-fail/ok status to a temperature-difference-based classification, enabling intelligent distinction between retryable and permanent failures

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system implements feedback by measuring temperatures during programming and reading operations, then using this temperature information to determine whether to register a block as bad or mark it for retry. This feedback loop prevents premature bad block registration for temporary failures while maintaining data protection for permanent failures

Inventive Principle:
Principle #23Feedback

2Loss of substance

If temperature measurement and analysis is implemented, then unnecessary block replacement is reduced, but device complexity increases

Engineering Contradiction:
Improvereserved block consumptionVSAvoidtemperature measurement system
Core Design Contradiction:
Loss of substanceVSDevice complexity

Solution Approach 1:

The patent employs a temperature sensor within the storage device that automatically measures program and read attempt temperatures without external intervention. The controller autonomously compares these temperatures and determines block status, making the system self-diagnosing and self-managing regarding temporary failures

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system performs preliminary temperature measurement during the programming operation itself, storing the program temperature for later comparison. This preliminary action enables the system to quickly determine whether a subsequent read failure is temporary or permanent without requiring complex real-time analysis

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Reduces unnecessary block replacement and conserves storage space by distinguishing between temporary and permanent read failures, optimizing memory block usage.

Implementation Method 1

a temperature sensor configured to measure an internal temperature of the storage device

Methodology Applied
Scientific EffectTemperature sensing: Thermistor

Data Source

PatentUS12511057B2Storage device and control method thereof
Publication Date: 2025.12.30 SAMSUNG ELECTRONICS CO LTD
  • US12511057B2 patent drawing
  • US12511057B2 patent drawing
  • US12511057B2 patent drawing

AI summary

A storage device includes a memory device including a plurality of memory blocks, a temperature sensor measuring an internal temperature of the storage device, and a controller, wherein the temperature sensor measures a program temperature at a point in time of programming data in the plurality of memory blocks, and the controller stores the program temperature of program memory blocks, wherein the controller determines at least one memory block failed to read the data programmed in the plurality of memory blocks, when the program temperature of the error block and a read attempt temperature fall within a driving guarantee temperature range, and the controller is configured to calculate a difference in temperature between the program temperature of the error block and the read attempt temperature, compares the difference in temperature and a guarantee magnitude, to register the error block as a bad block or a refresh candidate block.