Memory Device Calibration for High-Speed Data Sampling Accuracy

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

High-speed data transmission in memory devices reduces the 'data eye' duration, making data capture prone to errors, and existing calibration methods are ineffective for varying operating conditions and all data patterns.

Innovation Solution

A memory device provides a tuning data pattern over a serial peripheral interface bus to calibrate data sampling points, using different frequencies and patterns for long and short calibrations to compensate for timing variations, such as silicon processes and temperature fluctuations, allowing accurate data capture.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If high speed serial communication is used to increase data transmission frequency, then data transmission speed is improved, but the data eye width is reduced making data capture more error-prone

Engineering Contradiction:
Improvedata transmission frequencyVSAvoiddata capture accuracy
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent applies preliminary action by performing calibration of the data sampling point before actual high-speed data transmission. The memory controller adjusts the sampling point timing in advance based on training patterns exchanged between the memory controller and memory device, ensuring optimal capture timing is established before production data transfer begins. This preliminary calibration resolves the contradiction by preparing the system for reliable capture at high speeds without requiring continuous adjustment during operation.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If calibration is performed for specific operating conditions, then accuracy for those conditions is improved, but the calibration becomes ineffective for varying operating conditions and different data patterns

Engineering Contradiction:
Improvedata sampling accuracyVSAvoideffectiveness across varying conditions
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent implements universality by designing a calibration mechanism that handles multiple operating conditions and data patterns through a unified approach. The memory controller and memory device exchange training patterns that cover various data transitions (rising/falling edges, different patterns) and the calibration process adapts to different clock frequencies and operating conditions. This single calibration framework provides accurate sampling point adjustment across diverse conditions rather than requiring separate calibrations for each scenario.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent applies dynamics by making the data sampling point adjustable and adaptable rather than fixed. The calibration process dynamically determines the optimal sampling point timing based on actual signal characteristics observed during training pattern exchange. The sampling point can be adjusted in response to varying operating conditions such as temperature, voltage, and frequency changes, allowing the system to maintain accuracy across different environments rather than being locked to a predetermined timing.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS9214232B2Methods and apparatuses for calibrating data sampling points
Publication Date: 2015.12.15 MICRON TECHNOLOGY INC
  • US9214232B2 patent drawing
  • US9214232B2 patent drawing
  • US9214232B2 patent drawing

AI summary

Methods and apparatuses for calibrating data sampling points are disclosed herein. An example apparatus may include a memory that may be configured to receive a calibration command and an attribute. The memory may include a first register that is configured to store a tuning data pattern and a second register that is configured to receive and store the tuning data pattern stored in the first register. The second register may be further configured to store the tuning data pattern responsive, at least in part, to the memory receiving the calibration command. The memory may be configured to execute an operation on at least one of the tuning data pattern stored in the first register or the tuning data pattern stored in the second register based, at least in part, on the attribute.