Memory Cell State Detection for Reliable Data Storage

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Next-generation memory devices require high capacitance, low power consumption, and non-volatile properties without the need for refresh operations, while existing technologies face challenges in maintaining data reliability due to memory cell deterioration during write operations.

Innovation Solution

A memory device and method that determine the state of target memory cells for potential deterioration before writing new data, selectively erasing and programming cells to ensure accurate data storage by using a write/read circuit and control logic to manage resistance states and apply appropriate electrical signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If memory cells are continuously written without checking their state, then write speed is maintained, but data reliability deteriorates due to undetected memory cell deterioration

Engineering Contradiction:
Improvedata reliabilityVSAvoidwrite speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies preliminary action by detecting the state of memory cells before performing write operations. The control logic determines whether target memory cells are in a read margin range or deteriorated state prior to writing, and selectively applies erase operations in advance. This ensures data reliability is maintained without significantly impacting write speed, as the detection and conditional erase operations are performed quickly and efficiently.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If all memory cells are erased before programming, then data accuracy is improved, but operation time and energy consumption increase

Engineering Contradiction:
Improvedata accuracyVSAvoidoperation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies local quality by selectively erasing only those memory cells that are determined to be in a read margin range or deteriorated state, rather than erasing all memory cells uniformly. The control logic identifies specific target memory cells requiring erase operations based on their individual states, and performs erase operations only on those cells. This localized approach maintains data accuracy while significantly reducing operation time and energy consumption compared to blanket erase operations.

Inventive Principle:
Principle #3Local quality

3Reliability

If memory cell state is detected before every write operation, then data reliability is improved, but device complexity increases

Engineering Contradiction:
Improvedata reliabilityVSAvoidcontrol complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies self-service by enabling the memory device to autonomously detect the state of its own memory cells and make decisions about whether erase operations are needed before writing. The control logic within the memory device performs state detection and determines the appropriate write operation type (normal write or erase-then-write) without requiring external intervention. This self-service mechanism improves data reliability while minimizing the increase in device complexity, as the additional functionality is integrated into the existing control structure.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances data reliability by preventing errors during overwrite operations, extends memory cell lifespan, and reduces unnecessary operations, thereby maintaining stable performance and reducing maintenance needs.

Implementation Method 1

determining whether a state of each of the memory cells in the memory cell group is in a read margin range

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Implementation Method 2

writing the second data by selectively erasing the target memory cell according to a result of the determination and by programming the target memory cell to have a second state corresponding to the second data

Methodology Applied
Scientific EffectElectrical Conduction: Conduction (electrical)

Data Source

PatentUS9583189B2Memory device, operating and control method thereof
Publication Date: 2017.02.28 SAMSUNG ELECTRONICS CO LTD
  • US9583189B2 patent drawing
  • US9583189B2 patent drawing
  • US9583189B2 patent drawing

AI summary

A method of operating a memory device including a plurality of memory cells is provided. The method includes receiving a first write command, determining whether a target memory cell is deteriorated or not, in response to the first write command, and writing the second data by selectively erasing the target memory cell according to a result of the determination and by programming the target memory cell.