3D Memory Channel Voltage Control for Program Disturb

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Three-dimensional memory devices experience significant program disturb during operations, leading to data reliability issues due to voltage fluctuations across cell strings.

Innovation Solution

The memory device employs a control circuit to manage voltages applied to cell strings, maintaining or increasing channel voltages based on pre-set conditions to minimize program disturb, using a method that adjusts voltages during programming operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If voltage is applied to program selected memory cells in three-dimensional memory devices, then programming operation is achieved, but program disturb occurs in non-selected cell strings due to voltage fluctuations

Engineering Contradiction:
Improvedata reliabilityVSAvoidprogram disturb
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary anti-action by increasing the channel voltage of non-selected cell strings before and during the programming operation of selected memory cells. This preemptive voltage adjustment counteracts the voltage fluctuations that would otherwise cause program disturb in non-selected cell strings, thereby protecting data reliability without compromising the programming operation

Inventive Principle:
Principle #9Preliminary anti-action

Solution Approach 2:

The patent changes the voltage parameter dynamically during the programming operation. Specifically, it adjusts the channel voltage of non-selected cell strings based on the programming status of selected memory cells, using verify results to determine whether to maintain or increase the channel voltage, thus adapting to different operational stages to minimize program disturb

Inventive Principle:
Principle #35Parameter changes

2Reliability

If channel voltage of non-selected cell strings is increased during programming, then program disturb is reduced, but voltage management complexity increases

Engineering Contradiction:
Improveprogram operation reliabilityVSAvoidvoltage management complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements feedback control by using verify operation results to dynamically adjust the channel voltage of non-selected cell strings. The control circuit monitors the programming status of selected memory cells through verify operations and adjusts the channel voltage accordingly, creating a closed-loop system that automates voltage management and reduces manual intervention complexity

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10468113B2Memory device and operating method thereof
Publication Date: 2019.11.05 SK HYNIX INC
  • US10468113B2 patent drawing
  • US10468113B2 patent drawing
  • US10468113B2 patent drawing

AI summary

Disclosed are a memory device, including: a memory block including a plurality of cell strings; a peripheral circuit configured to set voltages for a program operation of selected memory cells in the cell strings, and program the selected memory cells by using the set voltages; and a control circuit configured to control the peripheral circuit so that the selected memory cells are programmed in response to a program command, and increase a channel voltage of non-selected cell strings including non-selected memory cells while the selected memory cells are programmed, and an operating method thereof.