Memory Device Channel Voltage Drop Prevention

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Solution Overview

Problem

Existing memory devices face challenges in preventing channel voltage drop during program operations, which can lead to disturbances and reduced reliability in data storage.

Innovation Solution

A method and memory device configuration that includes applying a pass voltage to a selected word line and a turn-on voltage to a source select line during a program operation, along with a channel precharge operation to maintain the channel voltage and prevent drops, thereby minimizing disturbances and enhancing data storage reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a program operation is performed on memory cell strings, then data is written to the memory, but channel voltage drops causing disturbances and reduced reliability

Engineering Contradiction:
Improvedata storage reliabilityVSAvoidchannel voltage drop
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary anti-action by performing a channel precharge operation before the program operation. This precharge operation raises the channel voltage to a higher potential state in advance, creating a voltage buffer that prevents the channel voltage from dropping during the subsequent program operation, thus counteracting the harmful voltage drop effect before it can occur

Inventive Principle:
Principle #9Preliminary anti-action

Solution Approach 2:

The patent implements preliminary action by executing the channel precharge operation prior to the program operation. The precharge operation prepares the memory cell strings by elevating the channel voltage, ensuring that when the program operation begins, the channel is already in an optimized voltage state that prevents disturbances and maintains reliability

Inventive Principle:
Principle #10Preliminary action

2Productivity

If conventional program operation is used, then writing speed is maintained, but channel voltage disturbances occur

Engineering Contradiction:
Improveprogram operation speedVSAvoidchannel voltage stability
Core Design Contradiction:
ProductivityVSStability of the object's composition

Solution Approach 1:

The patent applies preliminary action by performing the channel precharge operation before the program operation. This prepares the memory cell strings in advance by raising the channel voltage, ensuring stable voltage conditions during the program operation without compromising the writing speed

Inventive Principle:
Principle #10Preliminary action

3Stability of the object's composition

If channel precharge operation is applied, then channel voltage stability is improved, but operation time increases

Engineering Contradiction:
Improvechannel voltage stabilityVSAvoidprogram operation time
Core Design Contradiction:
Stability of the object's compositionVSLoss of time

Solution Approach 1:

The patent implements periodic action by applying the turn-on voltage to the source select line only during a specific portion of the program operation period, rather than continuously. This time-limited application of voltage maintains channel stability when needed while minimizing the overall time penalty of the precharge operation

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS11615847B2Memory device and operating method of the memory device
Publication Date: 2023.03.28 SK HYNIX INC
  • US11615847B2 patent drawing
  • US11615847B2 patent drawing
  • US11615847B2 patent drawing

AI summary

A memory device includes a plurality of memory cell strings, a peripheral circuit, and control logic. The plurality of memory cell strings are connected between a bit line and a common source line. The peripheral circuit is configured to perform a channel precharge operation and a program operation for the plurality of memory cell strings. The control logic is configured to control the peripheral circuit to apply a pass voltage to a selected word line among a plurality of word lines connected to the plurality of memory cell strings and to apply a turn-on voltage to a source select line connected to the plurality of memory cell strings, during a portion of a period in which the pass voltage is applied to the selected word line, in the program operation.