Column Repair in Memory via Data Shifting
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Solution Overview
Problem
Existing memory devices face inefficiencies in column repair, particularly when maintaining serial bit-shifting functionality, as previous approaches using fuse mapping and redundant sense amplifiers add additional calculations and processing time, especially during operations like addition and subtraction.
Innovation Solution
The implementation of sensing circuitry with a defective sense amplifier being column-repaired by shifting data through a redundant sense amplifier, allowing data to be moved between sensing components synchronously, thereby improving processing time and efficiency by bypassing defective components directly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If fuse mapping and redundant sense amplifiers are used for column repair, then defective sense amplifiers can be replaced, but processing time increases due to additional calculations
Solution Approach 1:
The patent pre-configures redundant sense amplifiers and establishes mapping relationships before defects occur. When a defect is detected, the system activates pre-prepared replacement pathways, avoiding the need for complex real-time calculations and multiple row cycles, thus reducing processing time while maintaining reliability
Solution Approach 2:
The patent creates redundant copies of sense amplifiers that can replace defective ones. These copies are pre-configured with the same functional characteristics, allowing direct substitution without requiring complex recalculation or remapping operations during normal processing, thereby maintaining speed while providing defect tolerance
2Reliability
If traditional column repair methods are used, then defective components can be bypassed, but serial bit-shifting functionality is disrupted requiring multiple row cycles
Solution Approach 1:
The patent segments the sensing circuitry into independent modular units, each with its own redundant backup. This segmentation allows individual defective units to be isolated and replaced without affecting the operational status of adjacent segments, enabling continuous serial bit-shifting operations to proceed uninterrupted through healthy segments
Solution Approach 2:
The patent introduces redundant sense amplifiers as intermediary elements that can mediate data flow when original components fail. These intermediaries maintain the continuity of serial bit-shifting operations by providing alternative transmission pathways, eliminating the need to restart operations with multiple row cycles
3Reliability
If redundant sense amplifiers are activated for repair, then data can be shifted through alternative paths, but additional calculations are required reducing processing efficiency
Solution Approach 1:
The patent pre-establishes the mapping relationships and alternative data paths before defects occur. When activation is needed, the system simply follows pre-computed routing instructions rather than performing complex real-time calculations, thereby maintaining processing efficiency while enabling reliable alternative data transmission
Solution Approach 2:
The patent changes the operational parameters of the sensing circuitry by switching between normal and redundant modes. This parameter change allows the system to activate pre-configured alternative paths without requiring complex recalculation, maintaining processing efficiency while ensuring data can be shifted through reliable channels
Data Source
AI summary
Apparatuses and methods related to column repair in memory are described. The sensing circuitry of an apparatus can include a first sensing component, a second sensing component, and a third sensing component. The second sensing component can include a defective sense amplifier that is column repaired. The apparatus can include a controller configured to use the sensing circuitry to shift data from the first sensing component to the third sensing component by transferring the data through the second sensing component. The second sensing component can be physically located between the first sensing component and the third sensing component.