Memory Device Concurrent Repair Detection Circuit
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Solution Overview
Problem
Current memory devices face challenges in detecting and addressing concurrent repair cases where both low and high banks of the same column, unsupported by a circuit, are simultaneously repaired, leading to reduced yield and operational failures.
Innovation Solution
A memory device system that includes a column repair controller and a method for detecting concurrent repair by storing and comparing test information from both low and high bank column lines, using CAM data to identify and manage repair operations, thereby preventing access failures and increasing yield.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If concurrent repair cases are not detected, then manufacturing yield is reduced, but implementing detection increases device complexity
Solution Approach 1:
The patent creates a copy of the repair column information from the system block into a separate detection circuit. This copy allows the detection of concurrent repair cases without modifying the original repair mechanism, thereby increasing yield through detection while maintaining the existing repair functionality and minimizing added complexity.
Solution Approach 2:
The patent introduces an intermediary detection circuit that mediates between the repair column information storage and the control logic. This intermediary component processes the repair information to detect concurrent repair cases, separating the detection function from the repair execution and allowing yield improvement without directly complicating the core repair mechanism.
2Reliability
If concurrent repair cases are detected and prevented, then access failure rate decreases, but detection and processing time increases
Solution Approach 1:
The patent performs preliminary detection of concurrent repair cases by comparing repair column information before access operations occur. By detecting and preventing concurrent repair cases in advance, the system avoids access failures during normal operation, improving reliability while minimizing the time penalty to only the detection phase rather than affecting operational performance.
3Ease of repair
If repair column information is stored in the system block, then repair functionality is maintained, but detection of concurrent repair cases becomes difficult
Solution Approach 1:
The patent segments the repair information handling into two parts: the system block stores the original repair column information to maintain repair functionality, while a separate detection circuit creates and processes a copy of this information for detection purposes. This segmentation allows both repair functionality and concurrent repair detection to coexist without interfering with each other.
Data Source
AI summary
A memory device includes a system block for storing test information and includes a data block including memory cells connected to a plurality of low bank column lines and a plurality of high bank column lines. The memory device also includes a column repair controller configured to detect, based on the test information, a concurrent repair column line in which a low bank column line among the plurality of low bank column lines and a high bank column line the plurality of high bank column lines corresponding to the same column address are concurrent repaired.