Memory Control Circuit Unit Switching Programming Modes for Power Loss Recovery
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Solution Overview
Problem
The existing power-off test methods for rewritable non-volatile memory modules, such as 3D NAND flash memory, are inefficient due to the increasing storage capacity, leading to prolonged testing times when repeatedly performing programming or erasing operations, especially during unexpected power losses.
Innovation Solution
A data storing method that determines the power loss state as unexpected and switches to single-page programming mode to reduce recovery time and increase efficiency, by detecting power loss types, recording power loss information, and performing sudden power-off recovery operations using the single-page programming mode.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multi-page programming mode is used to increase storage capacity, then storage capacity is improved, but programming time is increased
Solution Approach 1:
The system dynamically switches between single-page programming mode and multi-page programming mode based on the detected power loss state. When unexpected power loss is detected, it uses single-page mode for faster programming; otherwise, it uses multi-page mode for higher capacity utilization, making the programming mode adaptable to different operational conditions
Solution Approach 2:
The invention changes the programming parameter (programming mode) based on the power loss state. By detecting whether power loss is unexpected or normal, the system adjusts the programming approach - using single-page programming (faster, lower capacity) for unexpected power loss scenarios and multi-page programming (slower, higher capacity) for normal operations
2Reliability
If repeated programming or erasing operations are performed during power-off test, then power-off protection function is verified, but testing time is increased
Solution Approach 1:
The testing process dynamically adjusts the programming mode based on detected power loss states during testing. When unexpected power loss is detected during the power-off test, the system switches to single-page programming mode to complete the test faster, reducing overall testing time while still verifying power-off protection functionality
3Speed
If single-page programming mode is used to reduce programming time, then programming speed is improved, but storage capacity is reduced
Solution Approach 1:
The system dynamically selects between single-page and multi-page programming modes based on the power loss state. Single-page mode is used when unexpected power loss is detected (prioritizing speed), while multi-page mode is used during normal operations (prioritizing capacity), making the system adaptable to different operational requirements
Data Source
AI summary
A data storing method, a memory control circuit unit and a memory storage device are provided. The method includes the following. When the memory storage device is powered-on, it is determined whether a power loss state of the memory storage device matches an unexpected power loss state according to a power-off instruction. Data is written into a plurality of physical programming units using a single-page programming mode and not using a multi-page programming mode when it is determined that the power loss state matches the unexpected power loss state.