Memory Control Circuit Voltage Calibration for Wear
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Solution Overview
Problem
Conventional read voltage calibration mechanisms fail to accurately calibrate read voltage levels in memory storage devices as memory cells wear out, leading to misjudgment of memory cell states and reduced service life.
Innovation Solution
A voltage calibration method that involves reading data from multiple physical units using different read voltage levels, obtaining count information reflecting the number of memory cells meeting a default condition, and calibrating the read voltage level based on this information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional read voltage calibration mechanism is used, then initial read accuracy is maintained, but calibration accuracy deteriorates as memory cells wear out
Solution Approach 1:
The patent performs preliminary actions by reading data from multiple physical units and obtaining count information about memory cells meeting default conditions before calibration. This preliminary data collection from multiple units allows the system to proactively adjust read voltage levels based on aggregated wear patterns, preventing misjudgment before it occurs and extending reliable operation beyond what single-unit calibration could achieve.
2Measurement precision
If read voltage level is not calibrated, then device operation is simple, but data read accuracy deteriorates due to memory cell wear
Solution Approach 1:
The patent segments the calibration process by dividing it into distinct phases: reading data from multiple physical units, obtaining count information about memory cells meeting default conditions, and then calibrating based on this aggregated information. This segmentation transforms a potentially complex continuous calibration problem into manageable discrete steps, making the overall mechanism more implementable while maintaining accuracy.
3Productivity
If conventional calibration is performed on single physical unit, then calibration process is simple, but calibration efficiency is insufficient
Solution Approach 1:
The patent merges calibration operations across multiple physical units by reading data from several units simultaneously and aggregating count information about memory cells meeting default conditions. This merging allows the system to perform a single comprehensive calibration that accounts for wear patterns across multiple units, significantly improving calibration efficiency compared to performing separate calibrations on each unit while managing complexity through unified processing.
Data Source
AI summary
A voltage calibration method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: reading first data from a first physical unit using a first read voltage level and reading second data from at least one second physical unit using a second read voltage level; obtaining count information reflecting a total number of memory cells meeting a default condition in the first physical unit and the at least one second physical unit according to the first data and the second data; and calibrating the first read voltage level according to the count information.