Memory Controller Selecting Access Time by Address and Temperature

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Solution Overview

Problem

In 3D memory arrays, the varying resistance of coupling structures due to geometry and temperature leads to longer average memory access times and reduced throughput, as existing methods use worst-case time constants for memory access, resulting in inefficiencies.

Innovation Solution

A system and method that select and adjust memory access time intervals based on specific memory addresses and current operating temperature, using temperature adjustment parameters to optimize the RC time constant of coupling structures between the memory controller and memory cells.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If worst-case time constants are used for memory access, then reliability is improved, but average memory access time increases and throughput decreases

Engineering Contradiction:
Improvememory access reliabilityVSAvoidmemory throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the memory access time interval based on temperature conditions. The system monitors temperature and selects different time interval parameters from a set of predefined values, allowing the memory controller to optimize access time according to actual operating conditions rather than using fixed worst-case values throughout operation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements dynamics by making the memory access time interval adaptive rather than static. The time interval parameter changes dynamically in response to temperature variations, enabling the system to transition between different performance states (faster access when cool, more conservative when hot) to balance speed and reliability under varying conditions.

Inventive Principle:
Principle #15Dynamics

2Reliability

If worst-case time constants are used for memory access, then operational reliability is improved, but average memory access time increases

Engineering Contradiction:
Improveoperational reliabilityVSAvoidaverage memory access time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the memory access time interval based on temperature conditions. The system monitors temperature and selects different time interval parameters from a set of predefined values, allowing the memory controller to optimize access time according to actual operating conditions rather than using fixed worst-case values throughout operation.

Inventive Principle:
Principle #35Parameter changes

3Productivity

If temperature adjustment parameters are used to optimize RC time constant, then memory access time is reduced and throughput is increased, but system complexity increases

Engineering Contradiction:
Improvememory throughputVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the memory access time interval based on temperature conditions. The system monitors temperature and selects different time interval parameters from a set of predefined values, allowing the memory controller to optimize access time according to actual operating conditions rather than using fixed worst-case values throughout operation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements self-service by having the memory controller automatically monitor temperature and adjust its own access time parameters without external intervention. The system serves itself by internally managing the temperature-compensation logic, selecting appropriate time intervals based on sensed conditions, thereby optimizing performance autonomously.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces average memory access time and increases memory array throughput by accounting for variations in resistance and temperature, enhancing operational reliability.

Implementation Method 1

the varying resistance of coupling structures due to geometry and temperature

Methodology Applied
Scientific EffectTemperature-dependent resistance: Electrical Resistance

Data Source

PatentUS9646660B2Selectable memory access time
Publication Date: 2017.05.09 INTEL NDTM US LLC
  • US9646660B2 patent drawing
  • US9646660B2 patent drawing
  • US9646660B2 patent drawing

AI summary

The present disclosure relates to selectable memory access time. An apparatus includes a memory controller. The memory controller is configured to select a memory access time interval duration parameter based, at least in part, on a memory address identifier, in response to receiving a memory access request; to adjust the selected memory access time interval duration parameter based, at least in part, on a current operating temperature; and perform a requested memory access operation on a memory array, a duration of the memory access operation related to the adjusted memory access time interval duration parameter.