Memory Controller Bad Block Recycling for Flash Lifespan
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Solution Overview
Problem
Existing memory devices face challenges in extending their lifespan due to the accumulation of bad blocks, which can lead to reduced performance and storage capacity over time.
Innovation Solution
A memory controller that generates a device health descriptor based on device information to determine the recycling of bad blocks, using a flash translation layer and bad block controller to identify and recycle pages in bad blocks when the memory device reaches a critical level, thereby extending its lifespan.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If bad blocks are replaced with reserved blocks, then reliability is improved, but device complexity increases and lifespan is reduced due to finite reserved blocks
Solution Approach 1:
The patent recovers valid pages from bad blocks by identifying pages that passed verification and transferring them to free blocks. This transforms previously discarded bad blocks into reusable storage resources, extending device lifespan while maintaining reliability through continuous bad block recycling monitoring
Solution Approach 2:
The system performs self-diagnosis by monitoring its own health status through device health descriptors and bad block tables. The memory controller automatically identifies bad blocks, recovers valid data, and manages recycling without external intervention, enabling the device to serve itself in maintaining reliability and extending lifespan
2Reliability
If device health monitoring is implemented, then reliability is improved, but device complexity increases
Solution Approach 1:
The device health descriptor serves multiple functions: it tracks device life status, identifies bad blocks, triggers recycling operations, and monitors overall health. This multi-functional approach consolidates monitoring complexity into a single unified structure, improving reliability without proportionally increasing device complexity
Solution Approach 2:
The system implements continuous feedback loops where device health descriptors are generated, monitored, and used to trigger appropriate responses. Bad block tables provide feedback on specific failures, enabling automated recovery operations. This feedback mechanism maintains reliability through systematic monitoring while keeping complexity manageable through structured information flow
Data Source
AI summary
The present technology relates to an electronic device. A memory controller controls a memory device such that a life of the memory device is increased. The memory controller that controls the memory device includes a flash translation layer configured to generate a device health descriptor based on device information received from the memory device, and a bad block controller configured to generate a bad block table based on bad block information received from the memory device, and generate recycling information for recycling pages in bad blocks recorded in the bad block table based on the device health descriptor.