Memory Controller Dynamic Repair Mechanism

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Solution Overview

Problem

As memory devices become increasingly miniaturized, failures or faults in memory cells due to PVT variations and data patterns increase, leading to errors that can progress from correctable to uncorrectable, potentially rendering the memory device faulty and unusable if not handled appropriately.

Innovation Solution

The implementation of a memory system with a memory controller that includes a repair memory region, an error correction code decoder, an error logger, and a dynamic repair remapper, which dynamically backs up data from faulty memory cells to the repair memory region when error occurrence counts reach a threshold, preventing the memory device from being deemed faulty and extending its lifespan.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If memory cells are miniaturized to increase storage capacity, then storage density is improved, but failure rate due to PVT variations increases

Engineering Contradiction:
Improvestorage capacityVSAvoidfailure rate
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The memory device is divided into multiple memory regions, each with its own error correction and monitoring mechanisms. When failures are detected in a specific region, that region can be isolated or repaired independently while other regions continue to operate, thus maintaining overall system reliability while supporting high storage capacity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system performs preliminary error detection and correction using ECC codes before failures propagate. By continuously monitoring error rates and performing corrective actions in advance, the system prevents minor failures from escalating into device-level failures, addressing the reliability issue without sacrificing storage capacity.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If error correction is performed continuously to maintain reliability, then failure detection is improved, but processing time increases

Engineering Contradiction:
Improvefailure detectionVSAvoidprocessing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

Instead of continuous error correction, the system performs error detection and correction at periodic intervals or triggered by specific conditions such as threshold error rates. This periodic approach maintains reliability through regular checking while minimizing processing time by avoiding unnecessary continuous operations.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The error correction system operates autonomously based on predefined thresholds and conditions. When error rates exceed thresholds, the system automatically initiates correction procedures without requiring external intervention or continuous processing, thus maintaining reliability while reducing processing time overhead.

Inventive Principle:
Principle #25Self-service

3Duration of action of stationary object

If faulty memory cells are replaced in real-time to extend device lifetime, then operational continuity is improved, but device complexity increases

Engineering Contradiction:
Improvedevice lifetimeVSAvoidsystem complexity
Core Design Contradiction:
Duration of action of stationary objectVSDevice complexity

Solution Approach 1:

The system extracts and isolates faulty memory cells from the operational array, replacing them with spare cells or marking them for replacement. This extraction approach extends device lifetime by removing failing components while containing the complexity within localized replacement mechanisms rather than requiring system-wide complexity increases.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The system discards faulty memory cells through automated replacement mechanisms and recovers operational capacity by redistributing data to healthy cells or using spare cells. This process extends device lifetime through continuous renewal while managing complexity through automated, predefined replacement protocols rather than complex real-time decision-making.

Inventive Principle:
Principle #34Discarding and recovering

Data Source

PatentUS12254940B2Methods for real-time repairing of memory failures caused during operations, memory systems performing repairing methods, and data processing systems including repairing memory systems
Publication Date: 2025.03.18 SAMSUNG ELECTRONICS CO LTD
  • US12254940B2 patent drawing
  • US12254940B2 patent drawing
  • US12254940B2 patent drawing

AI summary

An operating method of a memory controller that controls an operation of a memory device that includes a memory region and a repair memory region. The operating method may include receiving an address associated with the memory region that is included in a first read command and data read out from the memory region associated with the address, decoding the data using an error correction code and detecting an error included in the data, generating error type information indicating a type of an error included in the data, updating, based on the error type information, a count value associated with the address, the count value indicating a number of times that the type of error indicated by the error type information has occurred for the address, comparing the count value with a threshold value, and backing up the data that is stored in the memory region associated with the address to the repair memory region when the count value is equal to the threshold value.