Memory Controller ECC Scheme Selection for Chip Error Patterns
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Volatile memory devices face increasing bit errors and decreased yield due to miniaturization, necessitating improved error correction methods in semiconductor memory systems.
Innovation Solution
A memory controller system that receives a decoding status flag from memory modules, differentiates between uncorrectable and correctable errors, and selects an appropriate error correction code (ECC) decoding scheme based on the number of each to optimize ECC decoding performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If miniaturization and increased integration are applied to memory devices, then storage capacity and integration are improved, but bit errors increase and yield decreases
Solution Approach 1:
The patent segments the ECC decoding process into multiple decoding schemes (first decoding scheme for single-bit errors, second decoding scheme for multi-bit errors). The system divides error correction into different stages based on error patterns, allowing targeted correction approaches that improve reliability without requiring increased redundancy that would reduce storage capacity.
Solution Approach 2:
The patent changes the decoding parameter dynamically by selecting different decoding schemes based on the detected error pattern. When a single-bit error is detected, the first decoding scheme is used; when multi-bit errors are detected, the second decoding scheme is activated. This parameter change allows the system to maintain high reliability while preserving storage capacity.
2Reliability
If conventional ECC decoding is used without dynamic scheme selection, then device complexity is low, but ECC decoding efficiency and reliability are insufficient
Solution Approach 1:
The patent implements a dynamic decoding scheme selection mechanism that adapts to the actual error conditions. The system monitors error patterns during decoding and switches between different decoding schemes based on the detected error type and magnitude. This dynamic approach improves ECC decoding efficiency by using the most appropriate correction method for each error scenario, while the complexity is managed through systematic decision logic.
Solution Approach 2:
The patent employs feedback mechanisms where the decoding status flag and error detection results are used to determine which decoding scheme to apply. The system continuously monitors the decoding process and adjusts the correction strategy based on real-time error information, creating a closed-loop control system that optimizes reliability without excessive complexity.
Data Source
AI summary
In a method of operating a memory controller, a decoding status flag is received from a memory module including a plurality of data chips and at least one parity chip. Each of the plurality of data chips and the at least one parity chip may include an on-die error correction code (ECC) engine. The decoding status flag is generated by the on-die ECC engines. A first number and a second number may be obtained based on the decoding status flag. The first number represents a number of first chips including an uncorrectable error that is uncorrectable by the on-die ECC engine. The second number represents a number of second chips including a correctable error that is correctable by the on-die ECC engine. At least one of a plurality of decoding schemes is selected based on at least one of the first number and the second number. A system ECC engine may perform ECC decoding on at least one of the first chips and the second chips based on the selected decoding scheme.