Memory Controller Mutex Delay for Interworking Test Timing

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Solution Overview

Problem

Existing technologies face challenges in performing interworking tests between external devices and storage devices, particularly due to the difficulty in obtaining sufficient time for testing and simulating malfunctions in storage devices.

Innovation Solution

The implementation of a response delay mechanism in storage devices, utilizing a mutex flag and counter fields in messages, allows external devices to perform interworking tests by suspending command execution for a predetermined waiting time, enabling thorough testing and error simulation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the storage device operates quickly and transmits results immediately, then productivity is improved, but the external device cannot obtain enough time to perform interworking tests

Engineering Contradiction:
Improveoperation speedVSAvoidtest time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The storage device proactively introduces a controllable delay mechanism before transmitting operation results. By using a mutex counter and flag system, the device can preemptively pause result transmission for a predetermined period, allowing the external device sufficient time to perform interworking tests without affecting normal operational productivity.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If the storage device operates normally without simulated malfunctions, then reliability is maintained, but it is difficult to perform tests on external device operations when malfunctions occur

Engineering Contradiction:
Improvenormal operationVSAvoidtest capability
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The storage device implements a dynamic control mechanism using mutex flags and counters that can adjust its operational behavior based on test requirements. The system can transition between normal operation mode and test mode by activating the mutex flag, allowing the external device to control the timing and duration of operation suspensions for comprehensive testing while maintaining normal reliability during standard operations.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12216938B2Interworking method external device and storage device
Publication Date: 2025.02.04 SK HYNIX INC
  • US12216938B2 patent drawing
  • US12216938B2 patent drawing
  • US12216938B2 patent drawing

AI summary

The present disclosure relates to a memory controller which supports an interworking method for a test between an external device and a storage device, and a host. The memory controller proposed in the present disclosure may include a first interface configured to communicate with an external device, a second interface configured to communicate with a memory, a command queue configured to store commands received from the external device and a processor configured to perform a control operation according to a command stored in the command queue, and suspend the performance of the control operation according to the command for a waiting time corresponding to a value of a mutex counter for the command, when a mutex flag for the command is activated.