Memory Controller Performance Information Storage
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current semiconductor memory devices lack a standardized method to provide performance information to host devices, making it difficult for them to assess the operational status and performance of the storage devices effectively.
Innovation Solution
A controller with a memory test controller and performance information storage is introduced, which receives test requests from external devices, performs tests, and stores the results, allowing host devices to retrieve performance information such as read and write speeds, enabling them to determine the normal operation of the storage device based on predetermined thresholds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If performance information storage is added to the controller, then performance information can be provided to host devices, but device complexity increases
Solution Approach 1:
The controller is designed to perform multiple functions: it not only controls the semiconductor memory device but also stores performance information and communicates it to host devices. This multi-functionality resolves the contradiction by integrating the performance storage capability within the existing controller structure, avoiding the need for separate dedicated storage components while maintaining the ability to provide performance information.
2Measurement precision
If test operations are performed to measure performance, then performance information becomes available, but operation time increases
Solution Approach 1:
Performance test operations are executed in advance to measure and store performance information before actual data storage operations. The controller performs read and write test operations, stores the results in the performance information storage, and makes this information available to host devices. This preliminary measurement approach allows host devices to retrieve performance data without waiting for real-time measurements during data operations.
Solution Approach 2:
The controller periodically performs test operations to update performance information in the performance information storage. Instead of continuous monitoring, test operations are conducted at intervals, and the updated performance information is stored and made available to host devices. This periodic approach balances measurement precision with time efficiency.
Data Source
AI summary
The present technology includes a controller controlling an operation of a semiconductor memory device in response to a test request received from an external device. The controller includes a memory test controller and a performance information storage. The memory test controller generates a command corresponding to a test request received from the external device. The performance information storage stores a test operation result of the semiconductor memory device performed in response to the command.