Memory Controller Read Voltage Estimation

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Solution Overview

Problem

Memory systems face challenges in accurately reading data due to shifts in threshold voltages of cell transistors over time, leading to uncorrectable errors and the need for a method to estimate a better read voltage that can handle overlapping distributions efficiently.

Innovation Solution

A memory controller estimates a better read voltage by determining the number of cell transistors with specific threshold voltages and using a quadratic curve approximation to find the voltage at the lower end of the distribution, allowing for reliable data read operations even with shifted threshold voltages.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a fixed read voltage is used for data reading, then the reading operation is simple and fast, but reading accuracy deteriorates due to threshold voltage shifts over time

Engineering Contradiction:
Improvereading accuracyVSAvoidvoltage control complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system performs preliminary actions by determining the number of cell transistors with specific threshold voltages (first and second values) before the actual data reading operation. Based on these determined values, the system calculates an optimal read voltage in advance. This preliminary voltage optimization ensures accurate reading despite threshold voltage shifts, while maintaining operational simplicity during the actual read process.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The read voltage is made dynamic rather than fixed. The system adjusts the read voltage based on the determined distribution of threshold voltages in the memory cells. By making the read voltage adaptable to the actual state of the memory cells (represented by the first and second values), the system maintains high reading accuracy while accounting for threshold voltage shifts over time.

Inventive Principle:
Principle #15Dynamics

2Reliability

If the read voltage is adjusted to handle threshold voltage shifts, then reading accuracy improves, but the reading operation becomes more complex and time-consuming

Engineering Contradiction:
Improvedata retrieval reliabilityVSAvoidreading time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system performs a simplified version of full voltage optimization. Instead of complex iterative adjustments or comprehensive threshold voltage distribution analysis, the system uses a practical approach by determining just two key values (first and second values representing the distribution). This partial optimization achieves sufficient reading accuracy for reliable data retrieval while keeping the time overhead acceptable.

Inventive Principle:
Principle #16Partial or excessive action

3Measurement precision

If the read voltage is optimized based on threshold voltage distribution, then reading accuracy improves, but the control mechanism becomes more complex

Engineering Contradiction:
Improvethreshold voltage measurement precisionVSAvoidread controller complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The read controller acts as an intermediary that simplifies the complex task of read voltage optimization. It determines the first and second values representing the threshold voltage distribution and uses these to calculate the optimal read voltage. This intermediary component handles the complexity internally, presenting a simple interface for the actual data reading operation while maintaining high measurement precision through its voltage optimization calculations.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS10180876B2Memory controller and semiconductor memory device
Publication Date: 2019.01.15 KIOXIA CORP
  • US10180876B2 patent drawing
  • US10180876B2 patent drawing
  • US10180876B2 patent drawing

AI summary

A memory controller includes: a host interface configured to receive a read command from the outside of the memory controller; and a read controller configured to perform a data read operation on a memory device according to the read command. The read controller performs a data read operation on a set of memory cells and determines a first and second values. The first value is a number of memory cells having a first threshold voltage among the set of memory cells, and the second value is a number of memory cells having a second threshold voltage among the set of memory cells. The read controller determines a first read voltage based on only the first and second values and performs a data read operation on the set of memory cells using the first read voltage.