Memory Controller State Check Block for Temperature Error Detection
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Solution Overview
Problem
Memory systems face challenges in quickly detecting errors in stored data across various temperature environments, leading to reliability degradation due to temperature changes.
Innovation Solution
A memory system with a memory controller that sets a state check memory block and manages a state check page and program memory block list for each temperature period, allowing for error detection and prevention of reliability issues by programming data in a state check page free of erased memory cells.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional error detection methods are used, then error detection capability is provided, but detection speed is slow and reliability degradation occurs due to temperature changes
Solution Approach 1:
The patent applies preliminary action by programming test data into the state check page before actual data storage operations. The memory controller proactively writes test patterns (e.g., all 1s or all 0s) into the state check page at specific temperature points, enabling future error detection without delaying normal operations. This preliminary testing mechanism allows the system to detect retention errors quickly when they occur, resolving the contradiction between reliable error detection and fast detection speed.
2Measurement precision
If comprehensive error checking is performed across all memory blocks, then detection accuracy is improved, but system complexity and operational overhead increase
Solution Approach 1:
The patent extracts the error detection function from the main memory storage area by creating a separate state check page dedicated to testing. Instead of checking all memory blocks comprehensively, the system isolates test operations into this dedicated page, which contains only the necessary test data. This extraction simplifies the error checking process while maintaining high detection accuracy for retention errors, as the state check page is specifically designed for this purpose and does not include unnecessary data from other memory blocks.
Solution Approach 2:
The patent applies local quality by creating a specialized state check page with specific properties different from regular data pages. The state check page is configured to hold only test data (such as uniform patterns of 1s or 0s) and is managed separately through the temperature-period-based program memory block list. This localized approach allows the system to perform accurate error detection on critical retention parameters without the complexity of checking all memory blocks, thus improving measurement precision while reducing device complexity.
3Reliability
If temperature-dependent error checking is implemented, then reliability under varying temperatures is improved, but management complexity increases
Solution Approach 1:
The patent segments the temperature range into discrete temperature periods (e.g., -40°C to 0°C, 0°C to 40°C, 40°C to 85°C) and creates corresponding program memory block lists for each period. This segmentation allows the memory controller to manage temperature-dependent error checking in an organized manner, selecting the appropriate test data and checking procedures based on the current temperature range. By dividing the complex temperature-dependent reliability management into discrete, manageable segments, the system improves reliability across varying temperatures while controlling management complexity through structured organization.
Solution Approach 2:
The patent utilizes parameter changes by adjusting the test data written to the state check page based on temperature conditions. Different temperature periods correspond to different test patterns or checking parameters, allowing the system to optimize error detection for each temperature range. The memory controller changes the test parameters (such as the pattern of data written or the threshold for detecting errors) according to the current temperature, thereby improving reliability under varying temperature conditions while managing complexity through parameterization rather than comprehensive redesign.
Data Source
AI summary
A memory system is provided to include a memory device and a memory controller. The memory controller is configured to set, for a first memory die, a state check memory block that is used to check a state of data stored in memory blocks included in the first memory die, and the memory controller is further configured to manage, for each of a plurality of temperature periods that are predetermined, (1) a state check page corresponding to a temperature period and included in the state check memory block and (2) a program memory block list indicating information on certain memory blocks programmed at a time that a temperature of the memory system falls within the temperature period.