Memory Controller Synchronization for eMCP Testing Speed
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Solution Overview
Problem
The existing testing mechanisms for embedded multimedia card modules with multi-chip packages, such as eMCP, face slow testing speeds and potential timing errors due to the use of common interfaces and lack of synchronization, leading to data jitter issues when testing flash memory modules.
Innovation Solution
A memory controller with synchronization mechanisms is introduced, featuring control logic that manages two interfaces to receive and transmit test data and results between an external device and a memory module, synchronizing clocks to enhance testing speed and accuracy by transmitting data at specific clock edges.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a common interface is used to reduce the number of I/O ports, then device complexity is reduced, but testing speed decreases and timing errors occur
Solution Approach 1:
The patent divides the testing interface into separate dedicated interfaces: a first interface for data transmission between the memory controller and memory, and a second interface for test data transmission between the memory controller and external testing device. This segmentation allows simultaneous independent operations, improving testing speed while maintaining manageable device complexity through functional separation.
2Device complexity
If a common interface is used for data transmission, then device complexity is reduced, but timing errors and data jitter occur
Solution Approach 1:
The patent segments the interface into dedicated first and second interfaces with separate clock signals (first clock signal and second clock signal). This allows independent timing control for data transmission and test operations, eliminating timing errors and data jitter while keeping the overall interface structure organized and manageable.
Solution Approach 2:
The patent introduces separate clock signals with adjustable frequencies for different interfaces. The first clock signal controls the data interface while the second clock signal controls the test interface, allowing independent parameter optimization for each function to ensure timing accuracy and eliminate data jitter.
3Device complexity
If the debug circuit is placed at the last stage, then device complexity is reduced, but data jitter and errors increase
Solution Approach 1:
The patent incorporates the debug circuit at the beginning of the signal transmission path, before data is transmitted to the memory. This allows test data to be prepared and synchronized in advance with proper clock timing, preventing data jitter and errors before they occur during transmission, rather than attempting to correct issues at the last stage.
Data Source
AI summary
A memory controller coupled between an external device and a memory is provided. The memory controller is coupled to the external device via a second interface and coupled to the memory via a first interface. The memory controller further includes a control logic to control the first interface and the second interface. The control logic sets the second interface to be at a receiving mode to receive a test data from the external device, and sets the first interface to be at a transmitting mode to transmit the test data to the memory. After a predetermined time, the control logic sets the first interface to be at the receiving mode to receive a test result from the memory, and sets the second interface to be at a transmitting mode to transmit the test result to the external device.