Memory Controller Wear-Error Identifier Generation

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Solution Overview

Problem

Memory devices using phase change materials face wear out due to frequent write operations, leading to errors, and existing identifier generation methods are vulnerable to decoding when the encryption algorithm is captured.

Innovation Solution

A memory controller performs a preset number of write operations on a redundancy region of a memory device, detects error bits in the read data, and generates an identifier based on these error bits, using a write/read operation control unit, error detection unit, and identifier generation unit.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a key and/or identifier are generated through a key and/or identifier generator having a specific encryption algorithm, then the identifier generation is systematic and reproducible, but the generated identifier may be easily decoded by an unapproved user when the encryption algorithm is captured

Engineering Contradiction:
Improveidentifier generation processVSAvoididentifier security
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent converts the harmful effect of wear-out errors (which occur during write operations) into a beneficial feature by using these errors as the basis for generating unique identifiers. The errors that would normally indicate device degradation are instead harnessed to create security keys, transforming a weakness into a security advantage.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The memory device generates its own unique identifier based on its inherent characteristics (wear-out errors) without requiring external intervention or stored secret information. Each device automatically produces its own security key through normal operation, making the security feature self-generating and device-specific.

Inventive Principle:
Principle #25Self-service

2Productivity

If frequent write operations are performed on phase change materials, then data can be written and updated, but the memory device experiences wear out leading to errors

Engineering Contradiction:
Improvewrite operation capabilityVSAvoidmemory device durability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent converts the harmful effect of wear-out errors (which occur during write operations) into a beneficial feature by using these errors as the basis for generating unique identifiers. The errors that would normally indicate device degradation are instead harnessed to create security keys, transforming a weakness into a security advantage.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Measurement precision

If identifiers are generated based on fabrication characteristics, then unique identification is achieved, but the process requires additional manufacturing steps

Engineering Contradiction:
Improvedevice identification accuracyVSAvoidmanufacturing process
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The memory device generates its own unique identifier based on its inherent characteristics (wear-out errors) without requiring external intervention or stored secret information. Each device automatically produces its own security key through normal operation, making the security feature self-generating and device-specific.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS10204037B2Memory device, memory controller and operation method thereof
Publication Date: 2019.02.12 SK HYNIX INC
  • US10204037B2 patent drawing
  • US10204037B2 patent drawing
  • US10204037B2 patent drawing

AI summary

An operation method of a memory controller may include: performing a preset number of write operations on a redundancy region of a memory device, reading data of the redundancy region of the memory device, and detecting error bits which occur in the data, and generating an identifier corresponding to the memory device based on the detected error bits.