Memory Controller Detecting Word-Line Shorts in NVM Blocks

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Solution Overview

Problem

Non-volatile memory (NVM) devices face failures such as word-line-to-substrate and word-line-to-word-line shorts, which are difficult to detect early, leading to data loss if not addressed promptly.

Innovation Solution

A memory controller system that identifies suspected short-circuit events by recognizing deviations in performance characteristics like readout errors, threshold voltage distribution, programming/erasure voltage, and electrical resistance between word lines and the substrate, allowing for early detection and corrective action.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional defect detection methods are used, then manufacturing and programming processes can be simplified, but short-circuit events are detected too late causing data loss

Engineering Contradiction:
Improveearly detection of short-circuit eventsVSAvoidcomplexity of performance characteristic monitoring
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system performs preliminary monitoring of performance characteristics (readout errors, threshold voltage distribution, programming/erasure voltage, electrical resistance) during normal operation to detect short-circuit events before they cause data loss. This early detection allows corrective action to be taken in advance.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The memory controller continuously monitors performance characteristics and compares them against threshold values or patterns to identify deviations indicating short-circuit events. This feedback mechanism enables real-time detection and response to emerging failures.

Inventive Principle:
Principle #23Feedback

2Reliability

If comprehensive monitoring of performance characteristics is implemented, then short-circuit detection capability is improved, but operational complexity increases

Engineering Contradiction:
Improvedetection accuracy of short-circuit eventsVSAvoidoperational simplicity of memory device
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The memory device autonomously monitors its own performance characteristics and identifies suspected short-circuit events without requiring external intervention. The memory controller automatically detects deviations, determines affected word lines, and can initiate corrective actions independently.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The monitoring system serves multiple functions: detecting word-line-to-substrate shorts, word-line-to-word-line shorts, and other memory defects through a unified approach that analyzes various performance characteristics simultaneously.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS9330783B1Identifying word-line-to-substrate and word-line-to-word-line short-circuit events in a memory block
Publication Date: 2016.05.03 APPLE INC
  • US9330783B1 patent drawing
  • US9330783B1 patent drawing
  • US9330783B1 patent drawing

AI summary

An apparatus includes a memory and a memory controller. The memory includes a memory block that includes memory cells connected by word lines. The memory controller is configured to store data in the memory cells, and to identify a suspected short-circuit event in the memory block by recognizing a deviation of a performance characteristic of at least a given word line in the memory block relative to the performance characteristic of remaining word lines in the memory block.