Memory Controller Write Block Cluster Allocation for Wear Distribution

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Solution Overview

Problem

Current memory system controllers for solid state drives face challenges in efficiently managing write operations and wear leveling across multiple logical units (LUNs), leading to potential performance bottlenecks and reduced lifespan due to uneven program and erase cycles.

Innovation Solution

The implementation of a memory system controller with non-volatile memory control circuitry and memory management circuitry that allocates a write block cluster based on the host bus's information width and protocol, utilizing dynamic and static wear leveling techniques, such as garbage collection and block management, to distribute write operations across multiple LUNs, thereby minimizing wear and maximizing storage efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If write operations are concentrated on fewer LUNs, then write speed is improved, but wear on memory cells increases and lifespan decreases

Engineering Contradiction:
Improvewrite speedVSAvoidlifespan
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system segments write operations across multiple LUNs (Logical Unit Numbers) rather than concentrating them on a single LUN. The memory management circuitry divides the write block cluster into portions that are distributed to different LUNs, thereby spreading the wear across multiple memory cell arrays while maintaining high write throughput.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different LUNs are assigned different roles based on their wear state and performance characteristics. The memory management circuitry dynamically selects which LUNs to write to based on local conditions such as wear leveling status, available space, and performance metrics, optimizing both speed and lifespan locally for each LUN.

Inventive Principle:
Principle #3Local quality

2Reliability

If wear leveling is implemented across all LUNs, then lifespan is extended, but write speed decreases due to distributed operations

Engineering Contradiction:
ImprovelifespanVSAvoidwrite speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The wear leveling strategy is made dynamic rather than static. The memory management circuitry continuously monitors the state of each LUN and dynamically adjusts the distribution of write operations in real-time. This allows the system to adapt to changing conditions and optimize the balance between lifespan extension and write speed.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system maintains continuous write operations across multiple LUNs without interruption for wear leveling tasks. By integrating wear leveling into the normal write path, the system ensures that useful write actions continue uninterrupted while still achieving wear distribution, thereby maintaining high productivity while extending lifespan.

Inventive Principle:
Principle #20Continuity of useful action

3Device complexity

If block management is simplified, then device complexity is reduced, but wear distribution becomes uneven

Engineering Contradiction:
Improveblock management complexityVSAvoidwear distribution
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The memory management circuitry implements self-service block management by automatically monitoring wear states, selecting appropriate LUNs for write operations, and redistributing data as needed. This autonomous operation achieves effective wear distribution without requiring complex external control mechanisms, thereby balancing simplicity and reliability.

Inventive Principle:
Principle #25Self-service

4Productivity

If write block cluster size is increased, then throughput is improved, but memory controller complexity increases

Engineering Contradiction:
ImprovethroughputVSAvoidmemory controller complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The large write block cluster is segmented into smaller sub-blocks that can be independently managed and distributed across multiple LUNs. This segmentation reduces the complexity of managing each individual block while maintaining the high throughput benefits of large cluster writes by processing multiple segments in parallel.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9747029B2Apparatus including memory management control circuitry and related methods for allocation of a write block cluster
Publication Date: 2017.08.29 MICRON TECHNOLOGY INC
  • US9747029B2 patent drawing
  • US9747029B2 patent drawing
  • US9747029B2 patent drawing

AI summary

Memory system controllers can include non-volatile memory control circuitry including a plurality of channel control circuits. Each of the plurality of channel control circuits can be configured to be coupled to a respective number of logical units (LUNs). Memory management circuitry can be coupled to the non-volatile memory control circuitry and configured to allocate a write block cluster for host writes based on an information width of a host bus and a protocol of the host bus. The write block cluster can include one block from fewer than all of the LUNs.