Memory Controller Writing Rate Measurement via Management Area
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Solution Overview
Problem
Conventional memory access devices cannot accurately determine the writing rate of semiconductor memory cards due to lack of information about the internal state of the memory blocks, leading to potential issues with data recording, especially during real-time data capture in devices like digital still cameras.
Innovation Solution
The semiconductor memory device includes a nonvolatile data storing unit with a management information area that provides information about the internal state to the memory access device, allowing it to perform writing tests and determine optimal writing conditions, thereby enabling accurate writing rate measurement and optimization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the memory access device performs data writing without knowing the internal state of the semiconductor memory device, then the device complexity is reduced, but the measurement precision of writing rate is insufficient
Solution Approach 1:
The patent introduces a management information area as an intermediary component that stores and transmits internal state information (such as block erasure status, wear level, and performance characteristics) from the semiconductor memory device to the memory access device. This intermediary enables the host to make informed writing decisions without directly exposing complex internal structures, thereby improving measurement precision while maintaining reasonable device complexity.
Solution Approach 2:
The patent implements a feedback mechanism where the semiconductor memory device provides writing period information and internal state data back to the memory access device. The host uses this feedback to adjust writing strategies, select optimal blocks, and predict writing rates accurately. This closed-loop feedback system resolves the contradiction by enabling precise measurement and control without requiring the host to understand or manage the complex internal architecture directly.
2Reliability
If the semiconductor memory device provides detailed internal state information to the memory access device, then the reliability of data recording is improved, but the loss of information transmission overhead increases
Solution Approach 1:
The patent extracts only the essential internal state information needed for reliable data recording into a dedicated management information area. This extracted information includes block status, erasure count, and performance metrics - sufficient for reliability decisions but filtered to exclude unnecessary details. This selective extraction approach improves data recording reliability while minimizing information transmission overhead by transmitting only the critical subset of internal state data.
3Productivity
If the memory access device optimizes writing based on internal state information, then the productivity of data writing is improved, but the ease of operation decreases
Solution Approach 1:
The patent enables the memory access device to autonomously manage writing operations by providing it with the necessary internal state information through the management information area. The host can independently determine optimal writing blocks, adjust writing strategies, and predict performance without requiring complex external control or specialized knowledge of memory internals. This self-service capability improves data writing productivity while maintaining ease of operation by empowering the host with the information needed for intelligent decision-making.
Data Source
AI summary
A semiconductor memory card 1 includes a user data area 21 and a management information area 22, in a data storing unit 2. According to a writing test command from a memory access device 6, a memory controller 3 writes data into a user data storing area and measures the writing rate, and transmits the measurement result to the memory access device 6 via a host interface unit 4. Thereby, the memory access device 6 can recognize the writing rate.