Memory Current Test Circuit for Continuous Power Evaluation
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Solution Overview
Problem
Existing methods for evaluating power consumption in memory systems are complicated and lack accuracy due to the need for establishing test tables and the inability of oscilloscopes to continuously test current, leading to discontinuous data acquisition.
Innovation Solution
A current test circuit is integrated within the memory system to directly test current on memory pins, allowing for real-time monitoring and simplifying the testing process without the need for external equipment or specific environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If an oscilloscope is used to test current in discontinuous specific periods, then the test process can be simplified, but the accuracy of power consumption evaluation is reduced
Solution Approach 1:
The memory system integrates a current test circuit that can autonomously test current on its own pins without requiring external oscilloscopes or complex test tables. The test circuit includes current sensors connected to power pins, an analog-to-digital conversion circuit, and a buffer that can independently acquire, convert, and store current data, enabling the system to self-test and self-evaluate power consumption accurately and continuously.
2Measurement precision
If a test table with oscilloscope is established, then current can be tested, but the test process becomes complicated and requires specific test environments
Solution Approach 1:
The patent merges the current testing functionality directly into the memory system by integrating current sensors, analog-to-digital conversion circuits, and buffer memory within the memory chip itself. This eliminates the need for separate external oscilloscopes and complex test tables, allowing current measurement to be performed internally during normal operation without requiring specific test environments or additional equipment.
Solution Approach 2:
The memory system equips itself with integrated current sensing and measurement capabilities, enabling it to autonomously monitor its own power consumption without relying on external testing equipment. The test circuit can be activated during normal operation to self-evaluate power consumption, eliminating dependency on external oscilloscopes and complex test setups.
3Ease of operation
If current is tested only in discontinuous specific periods, then external equipment can be used, but continuous monitoring is not achieved and accuracy is influenced
Solution Approach 1:
The integrated current test circuit enables continuous current monitoring throughout the memory system's operation. The current sensors continuously monitor power pin current, the analog-to-digital conversion circuit continuously converts the signals, and the buffer continuously stores the data, eliminating the discontinuous sampling limitation of external oscilloscopes and ensuring accurate, continuous power consumption evaluation during all operational states.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables continuous and accurate power consumption evaluation by allowing current testing at any time and place, improving the accuracy of power consumption assessments.
Implementation Method 1
the current test circuit comprises an analog signal acquisition circuit and an analog-to-digital conversion circuit, an input terminal of the analog signal acquisition circuit is connected with the first test terminal and an output terminal of the analog signal acquisition circuit is connected with the input terminal of the analog-to-digital conversion circuit
Data Source
AI summary
The present disclosure includes a memory system, an electronic product and an operating method of the memory system. In an example of the present disclosure, a current test circuit is packaged inside the memory system including memory, which allows directly testing current on memory pins by the current test circuit. As such, on one hand, it is possible to test current of the memory without establishing any test table, and the test process is not environment-limited. On the other hand, because the current test circuit can test current on memory pins at any time, it is possible to monitor the current data of the memory in real time in the operation of memory, thereby improving accuracy of the power consumption evaluation.