Nonvolatile Memory Debugging Circuit for Interface Failure Diagnosis

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Solution Overview

Problem

Existing semiconductor memory devices lack effective debugging mechanisms for identifying failures in the interface between memory controllers and nonvolatile memory devices, making it difficult to diagnose and resolve operational issues.

Innovation Solution

A nonvolatile memory device with a debugging support circuit that stores and generates debugging information based on control and data signals, allowing for the output of this information in response to a debugging request, enabling the identification of failure causes in the interface between memory controllers and nonvolatile memory devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a debugging support circuit is added to the nonvolatile memory device, then debugging capability and fault identification are improved, but device complexity increases

Engineering Contradiction:
Improvedebugging capabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The debugging support circuit is implemented as a separate functional module within the nonvolatile memory device, distinct from the main memory array and control logic. This segmentation allows the debugging functions to be added without fundamentally redesigning the entire device architecture, thereby improving debugging capability while limiting the increase in overall device complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The debugging support circuit acts as an intermediary component that interfaces between the existing memory device components and external debugging tools or controllers. It captures and processes signals from the memory device's internal operations and presents this information in a format suitable for external analysis, enabling enhanced debugging capability without requiring extensive modifications to the core memory device architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If debugging information is stored and processed within the nonvolatile memory device, then fault identification accuracy is improved, but loss of time for normal operations increases

Engineering Contradiction:
Improvefault identification accuracyVSAvoidoperation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The debugging support circuit continuously captures and stores control signals and data signals during normal memory operations, preparing debugging information in advance. This preliminary action ensures that when a fault occurs or debugging is requested, the information is already available for immediate analysis, thereby improving fault identification accuracy without requiring additional time during critical operations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The debugging support circuit operates continuously in parallel with normal memory operations, constantly monitoring and storing relevant signals without interrupting the primary function of the memory device. This continuous operation ensures that debugging information is always up-to-date and accurate while minimizing impact on normal operation timing.

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS10761969B2Nonvolatile memory device and operation method thereof
Publication Date: 2020.09.01 SAMSUNG ELECTRONICS CO LTD
  • US10761969B2 patent drawing
  • US10761969B2 patent drawing
  • US10761969B2 patent drawing

AI summary

An operation method of a nonvolatile memory device includes receiving control signals and a data signal from external of the nonvolatile memory device, generating debugging information based on the control signals and the data signal, receiving a debugging information request from external of the nonvolatile memory device, and outputting the debugging information in response to the debugging information request.