Selective Memory Deck Inhibition for Yield Recovery
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Solution Overview
Problem
The existing memory device manufacturing process is inefficient due to the practice of discarding entire memory devices based on a single underperforming deck, leading to reduced yield and grading suppression, especially in 3D cross-point memory devices where performance testing determines the grade and price of the device.
Innovation Solution
Implementing selective inhibition by designating decks as active or inactive based on performance test results, allowing for re-claiming underperforming decks and grading memory arrays based on active decks only, thereby avoiding the discarding of entire arrays and enabling higher grades.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If entire memory devices are discarded based on a single underperforming deck, then performance reliability is ensured, but manufacturing yield and productivity deteriorate
Solution Approach 1:
The memory device is divided into multiple independent decks, each capable of being tested and evaluated separately. This segmentation allows the system to identify and isolate underperforming decks without discarding the entire memory device, thereby resolving the contradiction between ensuring reliability and maintaining manufacturing yield.
Solution Approach 2:
Different decks within the memory device are assigned different functional roles based on their performance characteristics. Underperforming decks are designated as inactive while performing decks are designated as active, allowing the system to maintain overall reliability through selective activation of reliable decks while preserving the potential of underperforming decks for alternative uses or future improvements.
2Reliability
If entire memory devices are discarded based on a single underperforming deck, then performance consistency is maintained, but manufacturing cost increases
Solution Approach 1:
By segmenting the memory device into testable decks, the system can perform targeted testing and evaluation of individual decks rather than discarding the entire device. This segmentation approach reduces manufacturing waste and lowers costs while maintaining performance consistency through selective activation of reliable decks.
Solution Approach 2:
Instead of discarding entire memory devices, the system recovers and reuses underperforming decks by designating them as inactive. This recovery approach preserves valuable manufacturing resources and reduces waste, thereby lowering manufacturing costs while maintaining overall device reliability through the active use of performing decks.
3Measurement precision
If performance testing is conducted on all decks, then grading accuracy is improved, but testing time and complexity increase
Solution Approach 1:
The testing process is segmented to evaluate each deck independently, allowing for accurate grading of individual decks without requiring exhaustive testing of all decks. This segmented approach improves grading accuracy for active decks while reducing overall testing time by focusing resources on decks that will be actively used.
Solution Approach 2:
The system performs partial testing and evaluation on decks, focusing testing resources on decks that will be designated as active. This partial action approach achieves sufficient grading accuracy for the active decks without the time cost of testing every single deck, thereby balancing measurement precision with time efficiency.
Data Source
AI summary
An example apparatus can include a memory array and control circuitry. The memory array can include a first portion including a first plurality of memory cells. The memory array can further include a second portion including a second plurality of memory cells. The control circuitry can be configured to designate the first portion as active responsive to a determination that the first portion passed a performance test. The control circuitry can be configured to designate the second portion as inactive responsive to a determination that the second portion failed the performance test.