Memory Device Defect Scanning via Periodic Media Scan
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Solution Overview
Problem
Existing memory sub-systems fail to effectively detect and address defects and degradation in individual memory dice on a die-by-die basis, leading to inefficiencies and increased system overhead due to uncorrectable errors and reduced performance over time.
Innovation Solution
Incorporating a defect scan component that performs periodic, aperiodic, or sporadic media scan operations to monitor, record, and report memory die defects and degradation, allowing for insight into individual memory dice health and enabling data recovery before transferring potentially erroneous data to the host system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If periodic media scan operations are performed to detect memory die defects, then reliability is improved, but productivity deteriorates due to additional system overhead
Solution Approach 1:
The patent implements periodic media scan operations that are triggered at predetermined time intervals or after a specific number of program-erase cycles have been performed on the memory device. This periodic approach allows defect detection to occur at optimal intervals without continuously monitoring, thereby maintaining reliability while minimizing the impact on system productivity.
2Measurement precision
If defect scan component is added to monitor individual memory dice, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The defect scan component is integrated into the memory sub-system controller, which already exists to manage memory operations. The controller utilizes its existing processing capabilities and resources to perform defect scanning, rather than requiring a completely separate dedicated scanning system. This self-service approach enables precise die-by-die monitoring while minimizing additional device complexity.
3Reliability
If data recovery operations are performed before transferring data to host, then reliability is improved, but loss of time increases
Solution Approach 1:
The system performs preliminary defect detection and data recovery operations during idle periods or background processes, before the host system requests data transfer. By proactively identifying and correcting defects in advance, the system ensures data integrity is maintained while minimizing the time impact during actual data transfer operations, as the recovery work has already been completed.
Data Source
AI summary
A method includes determining that a criteria involving a memory device is met and performing a defect scan involving memory dice of the memory device in response to the criteria being met. The method further includes determining, as part of performing the defect scan, whether at least one memory die of the memory device has experienced degradation. The defect scan is performed as part of a quality and reliability assurance test or a reliability demonstration test, or both.