Memory Device Power Saving via Preloaded Repair Data
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current memory devices, particularly ferroelectric RAM (FeRAM), consume excessive power due to inefficiencies in sensing and programming operations, especially when dealing with defective memory cells, as they require two separate operations that can lead to power wastage and data corruption.
Innovation Solution
Implementing a system with redundant memory cells and optimized plate configurations to reduce power consumption by masking defective columns and using redundant columns for data access, thereby minimizing unnecessary power usage during sensing and programming operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If sensing operations are performed on all column groups including redundant groups, then data access reliability is improved, but power consumption increases
Solution Approach 1:
The patent loads repair information into the sense amplifier before the sensing operation begins. This preliminary action allows the system to prepare replacement data in advance, enabling the sense amplifier to quickly substitute defective column data without requiring additional sensing cycles, thus maintaining reliability while reducing power consumption.
Solution Approach 2:
The patent extracts and separates the repair information from the main memory array, storing it in a dedicated location that can be quickly loaded into the sense amplifier. This separation allows the system to access repair data independently without affecting the main sensing operation, reducing the need to activate all column groups including redundant ones.
2Measurement precision
If defective columns are not masked and are included in sensing operations, then sensing completeness is improved, but power consumption and data corruption risk increase
Solution Approach 1:
The patent converts the harmful effect of defective columns into a beneficial process by using the sense amplifier to detect defective column outputs and automatically replace them with pre-loaded repair information. This transforms what would be a sensing failure into a controlled correction process, maintaining sensing completeness while avoiding the power wastage of re-sensing or activating redundant columns.
Solution Approach 2:
The sense amplifier acts as an intermediary between the memory array and the output. It receives data from all column groups including defective ones, identifies corrupted outputs, and substitutes them with repair information from the loaded repair data. This intermediary function maintains sensing completeness while preventing power wastage from additional sensing operations.
3Reliability
If redundant column groups are activated for every access operation, then defect repair capability is improved, but power consumption increases
Solution Approach 1:
The system performs preliminary loading of repair information into the sense amplifier before normal sensing operations. This advance preparation ensures that when defective columns are detected, the repair data is already available in the sense amplifier, eliminating the need to activate redundant column groups during each access operation and thereby reducing power consumption while maintaining defect repair capability.
Solution Approach 2:
The patent creates a copy of the repair information and loads it into the sense amplifier. This copying mechanism allows the system to have repair data readily available without maintaining active connections to redundant column groups, reducing power consumption while preserving the ability to repair defective columns when needed.
Data Source
AI summary
A memory device can include an array of memory cells comprising groups of memory cells, the groups including at least one redundant group for repairing a defective group. The memory device can include a controller coupled to the array. Responsive to receiving a memory access command, the controller can detect whether a defective group is present. If a defect is present, sensing operations are not performed for the defective group. If no defect is present, sensing operations are not performed for the redundant group.