Semiconductor Memory Device Row Hammering Defense

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Solution Overview

Problem

Existing semiconductor memory devices face challenges in effectively performing target refresh operations to prevent row hammering, especially when the 2WL column repair scheme is applied, which complicates the determination of adjacent rows that require target refresh operations.

Innovation Solution

A semiconductor memory device is designed with row-hammer cells that store data on the number of accesses to each row and its paired row, allowing for the selection of a sampling address based on this data. The device includes a refresh control circuit that performs target refresh operations on adjacent rows of a target row and its paired row, optimizing the defense against row hammering and improving the accuracy and efficiency of refresh operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a 2WL column repair scheme is applied to repair defective columns using rows from different cell mats, then column repair capability is improved, but the complexity of determining which rows require target refresh operations increases

Engineering Contradiction:
Improvecolumn repair capabilityVSAvoidrefresh operation determination complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The memory device is divided into multiple cell mats (first cell mat and second cell mat), each with its own row-hammer cells that independently track access counts. This segmentation allows the system to manage refresh operations for each cell mat separately, reducing the complexity of determining which rows need refreshing while maintaining comprehensive row hammering protection across all repaired columns.

Inventive Principle:
Principle #1Segmentation

2Reliability

If target refresh operations are performed on all adjacent rows to prevent row hammering, then data protection is improved, but power consumption increases

Engineering Contradiction:
Improvedata protection against row hammeringVSAvoidpower consumption during refresh operations
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

Row-hammer cells are integrated into each row structure to autonomously count the number of times that row and its paired row are activated. When the access count reaches a threshold, the system automatically triggers a target refresh operation on that specific row and its adjacent rows. This self-monitoring mechanism ensures data protection is applied only where and when needed, minimizing unnecessary power consumption while maintaining robust protection against row hammering attacks.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If access count data is tracked for both a row and its paired row in the 2WL column repair scheme, then accuracy of refresh operation selection is improved, but the number of row-hammer cells and data storage requirements increase

Engineering Contradiction:
Improveaccuracy of refresh operation selectionVSAvoidnumber of row-hammer cells and data storage
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

Each row-hammer cell serves multiple functions: it counts activations for its associated row, indirectly monitors its paired row through the 2WL column repair relationship, and triggers refresh operations when thresholds are exceeded. This multi-functional design allows accurate tracking of access patterns across both cell mats without requiring separate counting mechanisms for each row, thereby reducing the overall number of row-hammer cells needed while maintaining high accuracy in refresh operation selection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS12283301B2Semiconductor memory device and operating method thereof
Publication Date: 2025.04.22 SK HYNIX INC
  • US12283301B2 patent drawing
  • US12283301B2 patent drawing
  • US12283301B2 patent drawing

AI summary

A semiconductor memory device includes: a memory cell region including a plurality of cell mats in each of which a plurality of rows are disposed, each row coupled to normal cells and row-hammer cells; a repair control circuit suitable for generating a pairing flag denoting whether a cell mat in which an active row corresponding to an active address is disposed, is repaired with another cell mat; and a refresh control circuit suitable for: selecting, when an active command is inputted, a sampling address based on first and second data read from the row-hammer cells of the active row, refreshing, when a target refresh command is inputted, one or more adjacent rows to a target row corresponding to the sampling address, and selectively refreshing, when the target refresh command is inputted, one or more adjacent rows to a paired row of the target row according to the pairing flag.