Memory Device Self-ID Information Storage and Retrieval
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Solution Overview
Problem
Existing memory devices lack a reliable method to store and retrieve self-identification information after packaging, making it difficult to discriminate defective devices and requiring lengthy testing processes.
Innovation Solution
Incorporating an information storage unit with a predecoder, input/output line driver, and data output driver to store and output self-ID information during a test mode, utilizing a combination of transistors and fuse units to decode addresses and control signal outputs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If no information storage unit is provided, then device complexity is reduced, but measurement precision and time required for defect discrimination deteriorate
Solution Approach 1:
The patent merges the information storage function with the existing bank structure by integrating an information storage unit into each bank. This allows defect information to be stored and retrieved without requiring a separate external storage system, thereby improving measurement precision while controlling device complexity through functional integration.
Solution Approach 2:
The information storage unit serves multiple functions: it stores defect addresses, manufacturing information, and enables both testing and identification operations. This multi-functionality allows a single integrated structure to provide precise defect discrimination without proportionally increasing device complexity.
2Productivity
If manual defect discrimination is performed, then device complexity is reduced, but loss of time increases
Solution Approach 1:
The memory device performs self-identification by automatically retrieving and outputting stored defect information through the information storage unit and output drivers. This eliminates the need for manual defect discrimination, significantly reducing testing time and improving productivity while maintaining acceptable device complexity.
Solution Approach 2:
Defect information is stored in the information storage unit during manufacturing before the device is deployed. This preliminary storage of defect addresses and characteristics enables rapid retrieval and identification during testing, eliminating time-consuming manual analysis and improving defect identification speed.
3Loss of information
If comprehensive information is stored, then measurement precision improves, but device complexity increases
Solution Approach 1:
The information storage unit is segmented into multiple fuse units, each storing specific defect information such as address bits. This segmentation allows comprehensive defect information to be stored in a modular fashion, improving information completeness while managing device complexity through structured organization of data storage elements.
Data Source
AI summary
Disclosed is a memory device including self-ID information. The memory device has a storage unit for storing information related to the memory device, such as a manufacturing factory, a manufacturing date, a wafer number, coordinates on a wafer and the like. Each bank of the memory device stores self-ID information related to the memory device and outputs the self-ID information out of a chip when an address is applied thereto during a test mode.