Memory Device Self-Testing and Repair Using Spare Cells
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Solution Overview
Problem
Conventional memory devices in electronic items often have defective memory cells and interconnections that are difficult and expensive to test and repair, especially when integrated into larger electronic systems.
Innovation Solution
Incorporating a memory device with non-volatile memory to store test and repair information, and a host device with a memory management unit that communicates with the memory device to perform self-testing and repair operations, using spare resources to replace defective portions without requiring external test equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If memory devices are integrated into electronic systems during manufacturing, then system functionality is improved, but testing and repair difficulty increases
Solution Approach 1:
The patent applies preliminary action by incorporating spare memory cells and interconnections into the memory device during manufacturing, before the device is integrated into the electronic system. This allows the memory device to self-test and self-repair using its built-in spare resources, eliminating the need for external test equipment after integration. The spare resources are reserved and configured to replace defective portions, enabling repair operations to be performed in-system without disassembly or specialized testing equipment.
2Manufacturing precision
If conventional testing methods are used on integrated memory devices, then manufacturing standards are maintained, but testing cost increases
Solution Approach 1:
The patent implements self-service by enabling the memory device to perform its own testing and repair operations using built-in spare resources. The memory device includes spare memory cells and interconnections that can be activated to replace defective portions, allowing the device to self-diagnose and self-repair without external intervention. This self-service capability maintains manufacturing precision through automated testing while eliminating the need for expensive external test equipment, thereby reducing testing costs.
3Ease of repair
If spare memory cells are included in memory devices, then repair capability is improved, but device complexity increases
Solution Approach 1:
The patent applies universality by designing spare memory cells and interconnections that can serve multiple functions: they remain dormant during normal operation, serve as backup resources when defects are detected, and can be reconfigured to replace various types of defective portions (memory cells, word lines, bit lines). This multi-functionality approach improves repair capability while minimizing added complexity, as the same spare resources handle diverse repair scenarios without requiring separate dedicated components for each defect type.
Data Source
AI summary
Some embodiments include apparatuses and methods having a first interface to communicate with a processing unit, a second interface to communicate with a memory device, and a module coupled to the first and second interfaces. In at least one of the embodiments, the module can be configured to obtain information stored in the memory device and perform at least one of testing and repairing of a memory structure of the memory device based at least in part on the information.