Memory Die Integrity Scanning Using Adaptive Block Health Metrics

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Solution Overview

Problem

Conventional memory sub-systems do not account for differences in error mechanisms experienced by different blocks, leading to sub-optimal scan frequencies that can result in overscanning or underscanning, affecting system performance and resource utilization.

Innovation Solution

Adaptive integrity scan rates are determined based on block health metrics, grouping blocks by error mechanisms and adjusting scan frequencies accordingly to optimize data integrity checks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional fixed scan frequencies are used for all memory blocks, then system simplicity is maintained, but data integrity reliability deteriorates due to overscanning or underscanning

Engineering Contradiction:
Improvedata integrityVSAvoidscan frequency management
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by assigning different scan frequencies to different memory blocks based on their individual health metrics and error mechanisms. Instead of using a uniform scan frequency across all blocks, the system categorizes blocks into groups (e.g., healthy, degraded, critical) and applies tailored scan rates to each group, optimizing data integrity while avoiding unnecessary scans on healthy blocks.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent implements dynamics by making scan frequencies adaptive and variable rather than fixed. The scan frequency for each memory block is dynamically adjusted based on real-time health metrics, error rates, and block age. This allows the system to respond to changing conditions and optimize performance over time.

Inventive Principle:
Principle #15Dynamics

2Reliability

If high scan frequencies are applied to all blocks, then data integrity is improved, but system performance deteriorates due to resource wastage

Engineering Contradiction:
Improvedata integrityVSAvoidsystem performance
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies local quality by concentrating scan resources on memory blocks that need them most based on their health status. Healthy blocks receive lower or no scan frequencies, while degraded or critical blocks receive higher scan frequencies. This localized approach ensures data integrity for at-risk blocks without unnecessarily impacting system performance through widespread scanning.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent applies partial action by performing scans only on specific memory blocks that require monitoring, rather than scanning all blocks uniformly. This selective scanning approach reduces overall scan workload and resource consumption while maintaining adequate data integrity monitoring where it is most needed.

Inventive Principle:
Principle #16Partial or excessive action

3Productivity

If low scan frequencies are used, then system performance is improved by reducing resource usage, but data integrity reliability worsens due to potential data corruption

Engineering Contradiction:
Improvesystem performanceVSAvoiddata integrity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent applies local quality by directing higher scan frequencies to degraded or critical memory blocks that are more susceptible to data corruption, while allowing healthy blocks to operate with lower scan frequencies. This ensures that blocks at risk of data integrity issues receive appropriate monitoring without uniformly impacting system performance.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent implements feedback by continuously monitoring memory block health metrics and adjusting scan frequencies accordingly. When blocks show signs of degradation or errors, the system increases their scan frequency to detect and address issues before data corruption occurs. This feedback-driven approach maintains data integrity while optimizing system performance.

Inventive Principle:
Principle #23Feedback

4Productivity

If adaptive scan rates based on block health metrics are implemented, then resource utilization is optimized, but device complexity increases

Engineering Contradiction:
Improveresource utilizationVSAvoidscan frequency management
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing memory blocks into distinct groups based on their health metrics and error characteristics. This segmentation allows the system to manage scan frequencies in a structured way, assigning different scan rates to different groups rather than individually managing each block, which reduces the effective complexity of the management system.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies parameter changes by using measurable health metrics (such as error rates, block age, and performance characteristics) to dynamically adjust scan frequencies. This parameter-based approach provides a systematic and automated method for managing scan rates, reducing the complexity of manual configuration while optimizing resource utilization.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20260031156A1Adaptive integrity scan rates in a memory sub-system based on block health metrics
Publication Date: 2026.01.29 MICRON TECHNOLOGY INC
  • US20260031156A1 patent drawing
  • US20260031156A1 patent drawing
  • US20260031156A1 patent drawing

AI summary

A processing device in a memory sub-system detects an occurrence of a data integrity check trigger event and, responsive to the occurrence of the data integrity check trigger event, identifies a memory die of a plurality of memory dies. The processing device further associates each segment of the identified memory die with a respective group of a plurality of groups, each group representing one or more of a plurality of error mechanisms, and determines one or more respective adaptive scan frequencies for the identified memory die based on statistics of the segments associated with each respective group.